Synthesis of GME zeolite with high porosity by hydrothermal conversion of FAU zeolite using a dual-template method with tetraethylphosphonium and N,N-dimethyl-3,5-dimethylpiepridinium hydroxides

2019 ◽  
Vol 26 (5) ◽  
pp. 1345-1352 ◽  
Author(s):  
Emi Mitani ◽  
Nao Tsunoji ◽  
Masahiro Sadakane ◽  
Tsuneji Sano
2008 ◽  
Vol 113 (1-3) ◽  
pp. 56-63 ◽  
Author(s):  
Hery Jon ◽  
Shoutarou Takahashi ◽  
Hitoshi Sasaki ◽  
Yasunori Oumi ◽  
Tsuneji Sano

2016 ◽  
Vol 283 ◽  
pp. 789-805 ◽  
Author(s):  
Akshay Jain ◽  
Rajasekhar Balasubramanian ◽  
M.P. Srinivasan

2020 ◽  
Vol 27 (17) ◽  
pp. 20675-20684
Author(s):  
Jingen Xi ◽  
Hui Li ◽  
Jiamin Xi ◽  
Shibei Tan ◽  
Jinlong Zheng ◽  
...  

2011 ◽  
Vol 325 (1) ◽  
pp. 96-100 ◽  
Author(s):  
Ayako Yashiki ◽  
Koutaro Honda ◽  
Ayumi Fujimoto ◽  
Shohei Shibata ◽  
Yusuke Ide ◽  
...  

2008 ◽  
Vol 16 (4) ◽  
pp. 465-471 ◽  
Author(s):  
H. Sasaki ◽  
H. Jon ◽  
M. Itakura ◽  
T. Inoue ◽  
T. Ikeda ◽  
...  

Author(s):  
H. M. Kerch ◽  
R. A. Gerhardt

Highly porous ceramics are employed in a variety of engineering applications due to their unique mechanical, optical, and electrical characteristics. In order to achieve proper design and function, information about the pore structure must be obtained. Parameters of importance include pore size, pore volume, and size distribution, as well as pore texture and geometry. A quantitative determination of these features for high porosity materials by a microscopic technique is usually not done because artifacts introduced by either the sample preparation method or the image forming process of the microscope make interpretation difficult.Scanning electron microscopy for both fractured and polished surfaces has been utilized extensively for examining pore structures. However, there is uncertainty in distinguishing between topography and pores for the fractured specimen and sample pullout obscures the true morphology for samples that are polished. In addition, very small pores (nm range) cannot be resolved in the S.E.M. On the other hand, T.E.M. has better resolution but the specimen preparation methods involved such as powder dispersion, ion milling, and chemical etching may incur problems ranging from preferential widening of pores to partial or complete destruction of the pore network.


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