A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

2008 ◽  
Vol 10 (S1) ◽  
pp. 89-96 ◽  
Author(s):  
Christopher M. Hoo ◽  
Natasha Starostin ◽  
Paul West ◽  
Martha L. Mecartney
2009 ◽  
Vol 29 (2) ◽  
pp. 638-640 ◽  
Author(s):  
Betina Giehl Zanetti-Ramos ◽  
Mauricia Beddin Fritzen-Garcia ◽  
Cristian Schweitzer de Oliveira ◽  
André Avelino Pasa ◽  
Valdir Soldi ◽  
...  

2010 ◽  
Vol 28 (5) ◽  
pp. 472-484 ◽  
Author(s):  
Betina Giehl Zanetti-Ramos ◽  
Mauricia Beddin Fritzen-Garcia ◽  
Tânia Beatriz Creczynski-Pasa ◽  
Cristian Schweitzer De Oliveira ◽  
André Avelino Pasa ◽  
...  

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