A refined denoising method for noisy phase-shifting interference fringe patterns

2021 ◽  
Vol 53 (8) ◽  
Author(s):  
E. Z. Omar
Keyword(s):  
Interference Fringe ◽  
Phase Shifting ◽  
Denoising Method ◽  
Fringe Patterns

Wide-angle lenses distortion calibration using phase demodulation of phase-shifting fringe-patterns

2020 ◽  
Vol 49 (6) ◽  
pp. 20200039
Author(s):  
周维帅 Weishuai Zhou ◽  
翁嘉文 Jiawen Weng ◽  
彭军政 Junzheng Peng ◽  
钟金钢 Jingang Zhong
Keyword(s):  
Phase Shifting ◽  
Wide Angle ◽  
Fringe Patterns ◽  
Phase Demodulation

Wide-angle lenses distortion calibration using phase demodulation of phase-shifting fringe-patterns

2020 ◽  
Vol 49 (6) ◽  
pp. 20200039
Author(s):  
周维帅 Weishuai Zhou ◽  
翁嘉文 Jiawen Weng ◽  
彭军政 Junzheng Peng ◽  
钟金钢 Jingang Zhong
Keyword(s):  
Phase Shifting ◽  
Wide Angle ◽  
Fringe Patterns ◽  
Phase Demodulation

Digital Recording of Interference Fringe Patterns Reconstructed by Reflection Hologram in the Course of Residual Stresses Determination

2005 ◽  
Vol 2 (2) ◽  
pp. 41-56 ◽  
Author(s):  
V. S. Pisarev ◽  
V. V. Balalov ◽  
A. V. Chernov ◽  
A. N. Vinogradova ◽  
E. V. Avdiushkin ◽  
...  
Keyword(s):  
Residual Stresses ◽  
Interference Fringe ◽  
Digital Recording ◽  
Reflection Hologram ◽  
Fringe Patterns

A New Three-Dimensional Profilometer for Surface Profile Measurement Using Digital Fringe Projection and Phase Shifting

2005 ◽  
Vol 295-296 ◽  
pp. 471-476
Author(s):  
Liang Chia Chen ◽  
S.H. Tsai ◽  
Kuang Chao Fan
Keyword(s):  
High Speed ◽  
Structured Light ◽  
Three Dimensional ◽  
Surface Profile ◽  
Phase Shifting ◽  
Fringe Projection ◽  
Surface Measurement ◽  
Profile Measurement ◽  
Digital Fringe Projection ◽  
Fringe Patterns

The development of a three-dimensional surface profilometer using digital fringe projection technology and phase-shifting principle is presented. Accurate and high-speed three-dimensional profile measurement plays a key role in determining the success of process automation and productivity. By integrating a digital micromirror device (DMD) with the developed system, exclusive advantages in projecting flexible and accurate structured-light patterns onto the object surface to be measured can be obtained. Furthermore, the developed system consists of a specially designed micro-projecting optical unit for generating flexibly optimal structured-light to accommodate requirements in terms of measurement range and resolution. Its wide angle image detection design also improves measurement resolution for detecting deformed fringe patterns. This resolves the problem in capturing effective deformed fringe patterns for phase shifting, especially when a coaxial optical layout of a stereomicroscope is employed. Experimental results verified that the maximum error was within a reasonable range of the measured depth. The developed system and the method can provide a useful and effective tool for 3D full field surface measurement ranging from µm up to cm scale.

Sign in / Sign up

Export Citation Format

Share Document