Characterization of source quality based on petrophysical logs and seismic data—a case study from Western Australia

2021 ◽  
Vol 14 (13) ◽  
Author(s):  
Yousef Asgari Nezhad ◽  
Ali Moradzadeh
Keyword(s):  
Western Australia ◽  
Seismic Data ◽  
Petrophysical Logs

scholarly journals An integrated petrophysical-based wedge modeling and thin bed AVO analysis for improved reservoir characterization of Zhujiang Formation, Huizhou sub-basin, China: A case study

2020 ◽  
Vol 12 (1) ◽  
pp. 256-274
Author(s):  
Wasif Saeed ◽  
Hongbing Zhang ◽  
Qiang Guo ◽  
Aamir Ali ◽  
Tahir Azeem ◽  
...  
Keyword(s):  
Seismic Data ◽  
Reservoir Characterization ◽  
Dominant Frequency ◽  
Well Logs ◽  
Amplitude Versus Offset ◽  
Avo Attributes ◽  
Thin Reservoir ◽  
Amplitude Versus

AbstractThe main reservoir in Huizhou sub-basin is Zhujiang Formation of early Miocene age. The petrophysical analysis shows that the Zhujiang Formation contains thin carbonate intervals, which have good hydrocarbon potential. However, the accurate interpretation of thin carbonate intervals is always challenging as conventional seismic interpretation techniques do not provide much success in such cases. In this study, well logs, three-layer forward amplitude versus offset (AVO) model and the wedge model are integrated to analyze the effect of tuning thickness on AVO responses. It is observed that zones having a thickness greater than or equal to 15 m can be delineated with seismic data having a dominant frequency of more than 45 Hz. The results are also successfully verified by analyzing AVO attributes, i.e., intercept and gradient. The study will be helpful to enhance the characterization of thin reservoir intervals and minimize the risk of exploration in the Huizhou sub-basin, China.

Construction of plastic contact deformation maps on ceramics: a case study on aluminum nitride

1996 ◽  
Vol 54 ◽  
pp. 636-637
Author(s):  
D. L. Callahan
Keyword(s):  
Plastic Deformation ◽  
Aluminum Nitride ◽  
Mechanical Response ◽  
Three Dimensional ◽  
Bright Field Image ◽  
Perfectly Plastic ◽  
Contrast Analysis ◽  
Deformation Patterns

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.

Integrating The Geophysical Characterization Of Seismic Thin Beds With Stochastic Reservoir Modeling: A Case Study From The Kutei Basin (Offshore Kalimantan, Indonesia)

2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  
Keyword(s):  
Reservoir Modeling ◽  
Geophysical Characterization

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

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