ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

2019 ◽  
Vol 30 (8) ◽  
pp. 1537-1544 ◽  
Author(s):  
Céline Noël ◽  
Yan Busby ◽  
Nicolas Mine ◽  
Laurent Houssiau
Keyword(s):  
Depth Profiling ◽  
Depth Resolution ◽  
Low Energy ◽  
Cesium Ions ◽  
Tof Sims ◽  
Sims Depth Profiling

Cesium redeposition artifacts during low energy ToF-SIMS depth profiling

2009 ◽  
Vol 255 (17) ◽  
pp. 7586-7589 ◽  
Author(s):  
R.G. Vitchev ◽  
J. Brison ◽  
L. Houssiau
Keyword(s):  
Depth Profiling ◽  
Low Energy ◽  
Tof Sims ◽  
Sims Depth Profiling

An effect of measurement conditions on the depth resolution for low-energy dual-beam depth profiling using TOF-SIMS

2013 ◽  
Vol 45 (8) ◽  
pp. 1261-1265 ◽  
Author(s):  
Atsushi Murase ◽  
Takuya Mitsuoka ◽  
Mitsuhiro Tomita ◽  
Hisataka Takenaka ◽  
Hiromi Morita
Keyword(s):  
Depth Profiling ◽  
Depth Resolution ◽  
Low Energy ◽  
Tof Sims ◽  
Dual Beam ◽  
Beam Depth

TOF-SIMS depth profiling of SIMON

2003 ◽  
Vol 203-204 ◽  
pp. 441-444
Author(s):  
Ge Xin ◽  
Gui Dong ◽  
Chen Xu ◽  
Cha Liangzhen ◽  
O. Brox ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Tof Sims ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of vitamin C layers using Cs+ and Xe+ ion beams

2010 ◽  
Vol 43 (1-2) ◽  
pp. 190-193 ◽  
Author(s):  
Nimer Wehbe ◽  
Laurent Houssiau
Keyword(s):  
Vitamin C ◽  
Depth Profiling ◽  
Ion Beams ◽  
Tof Sims ◽  
Sims Depth Profiling

TOF-SIMS depth profiling and element mapping on oxidized AlCrVN hard coatings

2008 ◽  
Vol 393 (8) ◽  
pp. 1857-1861 ◽  
Author(s):  
J. Schnöller ◽  
R. Franz ◽  
C. Mitterer ◽  
H. Hutter
Keyword(s):  
Depth Profiling ◽  
Hard Coatings ◽  
Tof Sims ◽  
Sims Depth Profiling ◽  
Element Mapping

Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information

2015 ◽  
Vol 26 (8) ◽  
pp. 1283-1290 ◽  
Author(s):  
Zhaoying Wang ◽  
Bingwen Liu ◽  
Evan W. Zhao ◽  
Ke Jin ◽  
Yingge Du ◽  
...  
Keyword(s):  
Depth Profiling ◽  
Insulating Materials ◽  
Tof Sims ◽  
Sims Depth Profiling

scholarly journals ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts

2012 ◽  
Vol 84 (11) ◽  
pp. 4880-4885 ◽  
Author(s):  
Michael A. Robinson ◽  
Daniel J. Graham ◽  
David G. Castner
Keyword(s):  
3D Imaging ◽  
Depth Profiling ◽  
3T3 Fibroblasts ◽  
Tof Sims ◽  
Nih 3T3 ◽  
Sims Depth Profiling

ToF-SIMS depth profiling of alumina scales formed on a FeCrAl high-temperature alloy

2004 ◽  
Vol 231-232 ◽  
pp. 850-853 ◽  
Author(s):  
J. Engkvist ◽  
U. Bexell ◽  
T.M. Grehk ◽  
M. Olsson
Keyword(s):  
High Temperature ◽  
Depth Profiling ◽  
Alumina Scales ◽  
High Temperature Alloy ◽  
Tof Sims ◽  
Sims Depth Profiling
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