Graphical analysis of accelerated life test data with a mix of failure modes

Microelectronics Reliability ◽

10.1016/0026-2714(76)90300-0 ◽

1976 ◽

Vol 15 (2) ◽

pp. 102

Keyword(s):

Test Data ◽

Failure Modes ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life

Download Full-text

Graphical Analysis of Accelerated Life Test Data with a Mix of Failure Modes

IEEE Transactions on Reliability ◽

10.1109/tr.1975.5215178 ◽

1975 ◽

Vol R-24 (4) ◽

pp. 230-237 ◽

Author(s):

Wayne Nelson

Keyword(s):

Test Data ◽

Failure Modes ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life

Download Full-text

Correction to ``Graphical Analysis of Accelerated Life Test Data with the Inverse Power Law Model''

IEEE Transactions on Reliability ◽

10.1109/tr.1972.5215984 ◽

1972 ◽

Vol R-21 (3) ◽

pp. 195-195

Keyword(s):

Test Data ◽

Power Law ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

Download Full-text

Graphical Analysis of Accelerated Life Test Data with the Inverse Power Law Model

IEEE Transactions on Reliability ◽

10.1109/tr.1972.5216164 ◽

1972 ◽

Vol R-21 (1) ◽

pp. 2-11 ◽

Author(s):

Wayne Nelson

Keyword(s):

Test Data ◽

Power Law ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

Download Full-text

Graphical analysis of accelerated life test data with inverse power law model

Microelectronics Reliability ◽

10.1016/0026-2714(72)90040-6 ◽

1972 ◽

Vol 11 (6) ◽

pp. 477

Keyword(s):

Test Data ◽

Power Law ◽

Graphical Analysis ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

Download Full-text

The prediction intervals of remaining useful life based on constant stress accelerated life test data

European Journal of Operational Research ◽

10.1016/j.ejor.2021.11.026 ◽

2021 ◽

Author(s):

Shuidan Qin ◽

Bing Xing Wang ◽

Wenhui Wu ◽

Chao Ma

Keyword(s):

Test Data ◽

Remaining Useful Life ◽

Constant Stress ◽

Prediction Intervals ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life ◽

Download Full-text

Analysis of Accelerated Life Test Data-Least Squares Methods for the Inverse Power Law Model

IEEE Transactions on Reliability ◽

10.1109/tr.1975.5215105 ◽

1975 ◽

Vol R-24 (2) ◽

pp. 103-107 ◽

Author(s):

Wayne Nelson

Keyword(s):

Least Squares ◽

Test Data ◽

Power Law ◽

Accelerated Life Test ◽

Inverse Power ◽

Power Law Model ◽

Life Test ◽

Inverse Power Law ◽

Accelerated Life

Download Full-text

Fitting the Weibull log-linear model to accelerated life-test data

IEEE Transactions on Reliability ◽

10.1109/24.877341 ◽

2000 ◽

Vol 49 (2) ◽

pp. 217-223 ◽

Author(s):

W. Wang ◽

D.B. Kececioglu

Keyword(s):

Linear Model ◽

Test Data ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life ◽

Download Full-text

Analysis of Accelerated Life Test Data - Part II: Numerical Methods and Test Planning

IEEE Transactions on Electrical Insulation ◽

10.1109/tei.1972.299187 ◽

1972 ◽

Vol EI-7 (1) ◽

pp. 36-55 ◽

Author(s):

Wayne Nelson

Keyword(s):

Numerical Methods ◽

Test Data ◽

Accelerated Life Test ◽

Life Test ◽

Test Planning ◽

Accelerated Life

Download Full-text

Optimal reliability acceptance sampling plan based on accelerated life test data

International Journal of Productivity and Quality Management ◽

10.1504/ijpqm.2020.108377 ◽

2020 ◽

Vol 30 (3) ◽

pp. 354

Author(s):

P.C. Ramyamol ◽

Mahesh Kumar

Keyword(s):

Test Data ◽

Sampling Plan ◽

Accelerated Life Test ◽

Acceptance Sampling ◽

Life Test ◽

Acceptance Sampling Plan ◽

Accelerated Life

Download Full-text

On the analysis of accelerated life test data

Microelectronics Reliability ◽

10.1016/0026-2714(86)90573-1 ◽

1986 ◽

Vol 26 (3) ◽

pp. 581

Keyword(s):

Test Data ◽

Accelerated Life Test ◽

Life Test ◽

Accelerated Life

Download Full-text