Software reliability growth models with testing-effort

1987 ◽  
Vol 27 (4) ◽  
pp. 786
Keyword(s):  
Software Reliability ◽  
Growth Models ◽  
Reliability Growth ◽  
Testing Effort ◽  
Software Reliability Growth Models ◽  
Software Reliability Growth

An Assessment of Incorporating Log-Logistic Testing Effort Into Imperfect Debugging Delayed S-Shaped Software Reliability Growth Model

2021 ◽  
Vol 9 (3) ◽  
pp. 23-41
Author(s):  
Nesar Ahmad ◽  
Aijaz Ahmad ◽  
Sheikh Umar Farooq
Keyword(s):  
Software Reliability ◽  
Growth Models ◽  
Least Square ◽  
Model Parameters ◽  
Reliability Growth ◽  
Imperfect Debugging ◽  
Testing Effort ◽  
Software Reliability Growth Models ◽  
Software Reliability Growth ◽  
Effort Function

Software reliability growth models (SRGM) are employed to aid us in predicting and estimating reliability in the software development process. Many SRGM proposed in the past claim to be effective over previous models. While some earlier research had raised concern regarding use of delayed S-shaped SRGM, researchers later indicated that the model performs well when appropriate testing-effort function (TEF) is used. This paper proposes and evaluates an approach to incorporate the log-logistic (LL) testing-effort function into delayed S-shaped SRGMs with imperfect debugging based on non-homogeneous Poisson process (NHPP). The model parameters are estimated by weighted least square estimation (WLSE) and maximum likelihood estimation (MLE) methods. The experimental results obtained after applying the model on real data sets and statistical methods for analysis are presented. The results obtained suggest that performance of the proposed model is better than the other existing models. The authors can conclude that the log-logistic TEF is appropriate for incorporating into delayed S-shaped software reliability growth models.

scholarly journals Bivariate Software Reliability Growth Models under Budget Constraint for Development Management

2019 ◽  
Vol 5 (1) ◽  
pp. 56-65
Author(s):  
Yuka Minamino ◽  
Shinji Inoue ◽  
Shigeru Yamada
Keyword(s):  
Software Reliability ◽  
Growth Models ◽  
Budget Constraint ◽  
Testing Time ◽  
Reliability Growth ◽  
Constant Elasticity ◽  
Testing Effort ◽  
Software Reliability Growth Models ◽  
Substitution Type ◽  
Software Reliability Growth

Software reliability growth is observed by investing not only the testing-time but also the testing-effort in the testing-phase of software development process. If the testing-time (testing-effort) is reduced to some extent, it is possible to observe the software reliability growth by investing the amount of testing-effort (testing-time) which can compensate the insufficiency of the testing-time (testing-effort). However, most of the existing software reliability growth models (SRGMs) are constructed as univariate models and the substitutability between the testing-time and testing-effort is not considered. Additionally, it is necessary to remove many faults efficiently within the budget. In this paper, we develop bivariate Weibull type SRGMs under budget constraint based on the Cobb-Douglas type and CES (constant elasticity of substitution) type testing-time functions. Simultaneously, we evaluate the substitutability between the testing-time and testing-effort factors which are software reliability growth factors. Finally, we conduct the sensitivity analysis and show numerical examples by using actual data sets.

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