Optimum simple step-stress accelerated life-tests with competing causes of failure

Microelectronics Reliability ◽

10.1016/0026-2714(92)90351-k ◽

1992 ◽

Vol 32 (12) ◽

pp. 1790

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

Competing Causes ◽

Causes Of Failure

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Optimum simple step-stress accelerated life-tests with competing causes of failure

IEEE Transactions on Reliability ◽

10.1109/24.106787 ◽

1991 ◽

Vol 40 (5) ◽

pp. 622-627 ◽

Author(s):

D.S. Bai ◽

Y.R. Chun

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

Competing Causes ◽

Causes Of Failure

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Weibull accelerated life tests when there are competing causes of failure

Communication in Statistics- Theory and Methods ◽

10.1080/03610928108828174 ◽

1981 ◽

Vol 10 (20) ◽

pp. 2073-2100 ◽

Author(s):

John P. Klein ◽

Asit P. Basu

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Competing Causes ◽

Causes Of Failure

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Design of Simple Step‐Stress Accelerated Life‐Tests

Accelerated Life Testing of One‐shot Devices ◽

10.1002/9781119664031.ch8 ◽

2021 ◽

pp. 119-139

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions

Reliability Engineering & System Safety ◽

10.1016/j.ress.2019.106630 ◽

2020 ◽

Vol 193 ◽

pp. 106630 ◽

Author(s):

M.H. Ling ◽

X.W. Hu

Keyword(s):

Optimal Design ◽

Weibull Distributions ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Inference in Simple Step-Stress Accelerated Life Tests for Type-II Censoring Lomax Data

Journal of Statistical Theory and Applications ◽

10.2991/jsta.d.210406.001 ◽

2021 ◽

Author(s):

Mohammad A. Amleh ◽

Mohammad Z. Raqab

Keyword(s):

Type Ii ◽

Type Ii Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Optimum simple step-stress accelerated life tests with censoring

IEEE Transactions on Reliability ◽

10.1109/24.46476 ◽

1989 ◽

Vol 38 (5) ◽

pp. 528-532 ◽

Author(s):

D.S. Bai ◽

M.S. Kim ◽

S.H. Lee

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Planning simple step-stress accelerated life tests using reference optimality criterion

Proceedings of the Institution of Mechanical Engineers Part O Journal of Risk and Reliability ◽

10.1177/1748006x15580469 ◽

2015 ◽

Vol 230 (1) ◽

pp. 85-92 ◽

Author(s):

Ancha Xu ◽

Yincai Tang ◽

Qiang Guan ◽

Xinze Lian

Keyword(s):

Optimality Criterion ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Optimum simple step-stress accelerated life tests for weibull distribution and type I censoring

Naval Research Logistics (NRL) ◽

10.1002/1520-6750(199303)40:2<193::aid-nav3220400205>3.0.co;2-j ◽

1993 ◽

Vol 40 (2) ◽

pp. 193-210 ◽

Author(s):

Do Sun Bai ◽

Myung Soo Kim

Keyword(s):

Weibull Distribution ◽

Type I ◽

Type I Censoring ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Planning Simple Step-Stress Accelerated Life Tests Using Bayesian Methods

IEEE Transactions on Reliability ◽

10.1109/tr.2011.2170104 ◽

2012 ◽

Vol 61 (1) ◽

pp. 254-263 ◽

Author(s):

Tao Yuan ◽

Xi Liu ◽

Way Kuo

Keyword(s):

Bayesian Methods ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Simple Step ◽

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Accelerated life tests under competing weibull causes of failure

Communication in Statistics- Theory and Methods ◽

10.1080/03610928208828388 ◽

1982 ◽

Vol 11 (20) ◽

pp. 2271-2286 ◽

Author(s):

John P. Klein ◽

Asit P. Basu

Keyword(s):

Accelerated Life Tests ◽

Accelerated Life ◽

Causes Of Failure

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