Intensity measurements in microwave spectroscopy the “antimodulation” method

Physica ◽  
1959 ◽  
Vol 25 (7-12) ◽  
pp. 859-888 ◽  
Author(s):  
A. Dymanus
1963 ◽  
Vol 34 (8) ◽  
pp. 901-907 ◽  
Author(s):  
Alan S. Esbitt ◽  
E. Bright Wilson

1973 ◽  
Vol 95 (19) ◽  
pp. 6182-6190 ◽  
Author(s):  
R. F. Curl ◽  
Tatsuya. Ikeda ◽  
R. S. Williams ◽  
Sharron. Leavell ◽  
L. H. Scharpen

1975 ◽  
Vol 30 (12) ◽  
pp. 1756-1764
Author(s):  
Otto L. Stiefvater

Abstract It is shown that there occur two easily distinguishable line shapes in DRM spectroscopy. These reflect the change of the integrated intensity of the signal transition when pump radiation is applied. They readily permit deductions concerning the position of the shared energy level. This result is useful for the analysis of complicated spectra, as is illustrated with examples.An expression is derived which permits the determination of the integrated intensity of absorption lines by DRM techniques alone. It does not require knowledge of the absolute value of the pump power and provides, therefore, a convenient basis for relative intensity measurements without recurrence to Stark effect modulation.


1990 ◽  
Vol 45 (9-10) ◽  
pp. 1131-1143
Author(s):  
Otto L. Stiefvater

Abstract The pure rotation spectra of molecules in 25 vibrationally excited states of perdeuterated furazan, C2D2N2O, have been studied by double resonance modulation (DRM) microwave spectroscopy. Twelve of these spectra have been correlated, -on the basis of relative intensity measurements under DRM -, with fundamental vibrations as previously established by IR spectroscopy. Rotational parameters for these 12 fundamental levels are reported, and the contributions to the effective rotational constants and to the inertia defect of the ground state of d2 -furazan have been determined for 10 modes of vibration.


1973 ◽  
Vol 4 (47) ◽  
pp. no-no
Author(s):  
R. F. CURL ◽  
TATSUYA IKEDA ◽  
R. S. WILLIAMS ◽  
SHARRON LEAVELL ◽  
L. H. SCHARPEN

Author(s):  
M.D. Ball ◽  
H. Lagace ◽  
M.C. Thornton

The backscattered electron coefficient η for transmission electron microscope specimens depends on both the atomic number Z and the thickness t. Hence for specimens of known atomic number, the thickness can be determined from backscattered electron coefficient measurements. This work describes a simple and convenient method of estimating the thickness and the corrected composition of areas of uncertain atomic number by combining x-ray microanalysis and backscattered electron intensity measurements.The method is best described in terms of the flow chart shown In Figure 1. Having selected a feature of interest, x-ray microanalysis data is recorded and used to estimate the composition. At this stage thickness corrections for absorption and fluorescence are not performed.


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