Generalized ellipsometric method for the determination of all the optical constants of the system: Optically absorbing film on an absorbing substrate

Surface Science ◽

10.1016/0039-6028(76)90433-7 ◽

1976 ◽

Vol 56 ◽

pp. 49-63 ◽

Author(s):

M. Malin ◽

K. Vedam

Keyword(s):

Optical Constants ◽

Absorbing Substrate ◽

Ellipsometric Method

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Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate Optical Constants of Silicon*

Journal of the Optical Society of America ◽

10.1364/josa.59.000064 ◽

1969 ◽

Vol 59 (1) ◽

pp. 64 ◽

Author(s):

K. Vedam ◽

W. Knausenberger ◽

F. Lukes

Keyword(s):

Optical Constants ◽

Optical Parameters ◽

Absorbing Substrate ◽

Ellipsometric Method

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Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*

Journal of the Optical Society of America ◽

10.1364/josa.62.000016 ◽

1972 ◽

Vol 62 (1) ◽

pp. 16 ◽

Author(s):

Samuel S. So ◽

K. Vedam

Keyword(s):

Optical Constants ◽

Film System ◽

Transparent Film ◽

Absorbing Substrate ◽

Ellipsometric Method

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Determination of the dispersion of the optical constants of a thin absorbing film on a transparent or weakly absorbing substrate

Journal of Applied Spectroscopy ◽

10.1007/bf00611521 ◽

1971 ◽

Vol 14 (1) ◽

pp. 110-113 ◽

Author(s):

E. P. Potapov ◽

A. V. Rakov

Keyword(s):

Optical Constants ◽

Absorbing Substrate

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Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurements

10.1117/12.191967 ◽

1994 ◽

Author(s):

Ivan Z. Indutnyi ◽

Apollinary I. Stetsun

Keyword(s):

Optical Constants ◽

Photometric Measurements ◽

Absorbing Substrate

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New Ellipsometric Method for the Determination of the Optical Constants of Thin Films and Surfaces*†

Journal of the Optical Society of America ◽

10.1364/josa.62.000010 ◽

1972 ◽

Vol 62 (1) ◽

pp. 10 ◽

Author(s):

S. C. Som ◽

Chitralekha Chowdhury

Keyword(s):

Optical Constants ◽

Ellipsometric Method

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Determination of optical constants of absorbing films upon a finite absorbing substrate

Optical Interference Coatings ◽

10.1364/oic.2001.tud4 ◽

2001 ◽

Author(s):

Ritta Vitlina ◽

Gregory Surdutovich

Keyword(s):

Optical Constants ◽

Absorbing Substrate

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Determination of optical constants (n, k, d) of very thin films deposited on absorbing substrate

Vacuum ◽

10.1016/j.vacuum.2004.07.009 ◽

2004 ◽

Vol 76 (2-3) ◽

pp. 185-189 ◽

Author(s):

P. Gushterova ◽

P. Sharlandjiev

Keyword(s):

Optical Constants ◽

Absorbing Substrate

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Determination of Spectral Optical Constants of Glazings by Numerical Integration from FTIR Spectrometer Measurements

10.26678/abcm.cobem2019.cob2019-2253 ◽

2019 ◽

Author(s):

Santiago Riquelme ◽

Nathan Mendes ◽

Luís Mauro Moura

Keyword(s):

Numerical Integration ◽

Optical Constants ◽

Ftir Spectrometer

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Determination of the optical constants of metal-halide perovskite nanocrystals

10.29363/nanoge.nipho.2020.038 ◽

2019 ◽

Author(s):

Gabriel Lozano ◽

Andrea Rubino ◽

Mauricio E. Calvo ◽

Hernán Míguez

Keyword(s):

Optical Constants ◽

Metal Halide ◽

Perovskite Nanocrystals ◽

Metal Halide Perovskite ◽

Halide Perovskite

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Multiple determination of the optical constants of thin-film coating materials: a Rh sequel

Applied Optics ◽

10.1364/ao.25.001299 ◽

1986 ◽

Vol 25 (8) ◽

pp. 1299 ◽

Author(s):

D. E. Aspnes ◽

H. G. Craighead

Keyword(s):

Thin Film ◽

Optical Constants ◽

Film Coating ◽

Thin Film Coating ◽

Coating Materials ◽

Multiple Determination

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