Determination of the optical constants of thin absorbing films on a slightly absorbing substrate from photometric measurements

Author(s):  
Ivan Z. Indutnyi ◽  
Apollinary I. Stetsun
1984 ◽  
Vol 11 (3) ◽  
pp. 141-148 ◽  
Author(s):  
T.S. Eriksson ◽  
A. Hjortsberg

1983 ◽  
Vol 61 (4) ◽  
pp. 612-616 ◽  
Author(s):  
Jean-Marc Theriault ◽  
Germain Boivin

In this paper, we describe a method of fabrication of metal–dielectric mixtures (cermets) deposited by vacuum evaporation. Our study is mainly concerned with co-evaporated mixtures of copper and lead iodide. The stabilization of the evaporation rate of copper and lead iodide enables us to obtain a homogeneous mixture of these twø materials whose mass concentration C is determined from a previous calibration. Photometric measurements carried out on these films lead to the determination of the optical constants N (the index of refraction) and K (the coefficient of absorption). We present here the results obtained for mixtures of low concentration in copper. These results are compared with those obtained from the Maxwell–Garnett theory.


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