New Ellipsometric Method for the Determination of the Optical Constants of Thin Films and Surfaces*†

1972 ◽  
Vol 62 (1) ◽  
pp. 10 ◽  
Author(s):  
S. C. Som ◽  
Chitralekha Chowdhury
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Ellipsometric Method

Determination of the Optical Constants of Thin Films Using Photoacoustic Spectroscopy

1981 ◽  
Vol 20 (9) ◽  
pp. L665-L668 ◽  
Author(s):  
Satoshi Yamasaki ◽  
Hideyo Okushi ◽  
Akihisa Matsuda ◽  
Hidetoshi Oheda ◽  
Nobuhiro Hata ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoacoustic Spectroscopy ◽  
Optical Constants

Optimization of Maximum VO2 Content in Polymorphous Oxides of Vanadium

2013 ◽  
Vol 538 ◽  
pp. 113-116 ◽  
Author(s):  
S.N. Svitasheva
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Optical Constants ◽  
Ellipsometric Method

Optical properties of thin films of vanadium thermally oxidized at air were studied by ellipsometric method using wavelength of He-Ne laser. Multipart composition of these films was revealed and method of optimization of technological conditions based on dynamic of changing optical constants near 68°C was developed.

Accurate Determination of Optical Constants of Amorphous Absorbing Thin Films by Spectroscopic Ellipsometry

2015 ◽  
Vol 35 (4) ◽  
pp. 0431001 ◽  
Author(s):  
李江 Li Jiang ◽  
李沛 Li Pei ◽  
黄峰 Huang Feng ◽  
魏贤华 Wei Xianhua ◽  
葛芳芳 Ge Fangfang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Accurate Determination

scholarly journals Experimental Determination of Complex Optical Constants of Air‐Stable Inorganic CsPbI 3 Perovskite Thin Films

2020 ◽  
Vol 14 (6) ◽  
pp. 2000070 ◽  
Author(s):  
Wensheng Yan ◽  
Yi Guo ◽  
Deski Beri ◽  
Stephan Dottermusch ◽  
Haining Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Experimental Determination ◽  
Optical Constants

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

2001 ◽  
Vol 40 (28) ◽  
pp. 5088 ◽  
Author(s):  
Chubing Peng ◽  
Rongguang Liang ◽  
J. Kevin Erwin ◽  
Warren Bletscher ◽  
Kenichi Nagata ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Multilayer Stacks

Determination of the optical constants and thickness of amorphous V2O5 thin films

1983 ◽  
Vol 102 (1) ◽  
pp. 71-76 ◽  
Author(s):  
L. Michailovits ◽  
I. Hevesi ◽  
Liem Phan ◽  
ZS. Varga
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
V2o5 Thin Films
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