Ellipsometric Method for the Determination of All the Optical Parameters of the System of an Isotropic Nonabsorbing Film on an Isotropic Absorbing Substrate Optical Constants of Silicon*

1969 ◽  
Vol 59 (1) ◽  
pp. 64 ◽  
Author(s):  
K. Vedam ◽  
W. Knausenberger ◽  
F. Lukes
Keyword(s):  
Optical Constants ◽  
Optical Parameters ◽  
Absorbing Substrate ◽  
Ellipsometric Method

DETERMINATION OF THE OPTICAL CONSTANTS AND THICKNESS OF SEMITRANSPARENT THIN FILMS USING SUCCESSIVE INTERFERENCE FRINGES OF TRANSMISSION SPECTRA

2005 ◽  
Vol 12 (03) ◽  
pp. 425-431 ◽  
Author(s):  
F. E. GHODSI
Keyword(s):  
Thin Films ◽  
Optical Constants ◽  
Optical Parameters ◽  
Transmission Spectra ◽  
Simple Method ◽  
Interference Fringes ◽  
True Values ◽  
Better Than ◽  
Good Agreement

A simple method for determination of optical constants and thickness of semitransparent thin films deposited onto a transparent finite substrate has been developed. The method is based on the analysis of successive interference fringes of transmission spectra created by the films. It is essentially not necessary to obtain the envelope of transmission spectra in this method. The determined values of optical parameters are in good agreement with their true values used to generate transmission data. The accuracy of method in determining refractive index and thickness of the films is better than 1%.

The optical constants of natural and artificial cuprite by an ellipsometric method

1978 ◽  
Vol 42 (324) ◽  
pp. 505-508 ◽  
Author(s):  
E. F. I. Roberts ◽  
P. Rastall
Keyword(s):  
Optical Constants ◽  
Cupric Oxide ◽  
Pure Copper ◽  
Surface Oxidation ◽  
Dielectric Constants ◽  
Refractive Indices ◽  
Optical Parameters ◽  
Total Oxidation ◽  
Oxidation Method ◽  
Ellipsometric Method

SummaryEllipsometric measurements in the spectral range 250–850 nm have been made on polished single crystals of natural cuprite from Namibia and of artificial cuprite grown by a total-oxidation method from pure copper. Derived values of the refractive indices, absorption coefficients, normal reflectances, and the complex dielectric constants for the two materials are all closely similar, suggesting that the stoichiometry and purity are essentially the same. Values of the absorption coefficient at the red end of the spectrum are inconsistent with the observed transparency of the crystals, and are compatible with a 10 nm surface oxidation film of cupric oxide. This study is part of a wider survey of the effects of doping and stoichiometry on the optical parameters of cuprite.

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