Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈1̄1̄1̄〉 and 〈100〉 orientations

1984 ◽  
Vol 143 (2-3) ◽  
pp. L417-L420 ◽  
Author(s):  
A.M. Narsale ◽  
B.M. Arora
1978 ◽  
Vol 49 (12) ◽  
pp. 5938-5943 ◽  
Author(s):  
B. Tell ◽  
F. P. J. Kuijpers

1989 ◽  
Vol 66 (3) ◽  
pp. 1199-1205 ◽  
Author(s):  
Ermanno Di Zitti ◽  
Giacomo M. Bisio ◽  
Pier Giorgio Fuochi ◽  
Bruno V. Passerini ◽  
Mauro Zambelli

Physica B+C ◽  
1985 ◽  
Vol 129 (1-3) ◽  
pp. 422-425 ◽  
Author(s):  
D. Stievenard ◽  
M. Lannoo ◽  
J.C. Bourgoin

2020 ◽  
Vol 60 (SB) ◽  
pp. SBBF01
Author(s):  
Chuang Li ◽  
Xia Hao ◽  
Yulu He ◽  
Jingquan Zhang ◽  
Lili Wu ◽  
...  

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