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An analysis of complex spectra from deep level transient capacitance measurements
Journal of Applied Physics
◽
10.1063/1.343463
◽
1989
◽
Vol 66
(3)
◽
pp. 1199-1205
◽
Cited By ~ 8
Author(s):
Ermanno Di Zitti
◽
Giacomo M. Bisio
◽
Pier Giorgio Fuochi
◽
Bruno V. Passerini
◽
Mauro Zambelli
Keyword(s):
Deep Level
◽
Capacitance Measurements
◽
Transient Capacitance
Download Full-text
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References
Deep level transient capacitance measurements of GaSb self-assembled quantum dots
Journal of Applied Physics
◽
10.1063/1.1318391
◽
2000
◽
Vol 88
(10)
◽
pp. 5843-5849
◽
Cited By ~ 17
Author(s):
R. Magno
◽
Brian R. Bennett
◽
E. R. Glaser
Keyword(s):
Quantum Dots
◽
Deep Level
◽
Capacitance Measurements
◽
Transient Capacitance
◽
Self Assembled
Download Full-text
Use of transient capacitance measurements for direct determination of minority‐carrier lifetime in low‐doped metal‐oxide‐semiconductor structures
Applied Physics Letters
◽
10.1063/1.95008
◽
1984
◽
Vol 45
(1)
◽
pp. 52-53
◽
Cited By ~ 2
Author(s):
U. Efron
◽
P. O. Braatz
Keyword(s):
Carrier Lifetime
◽
Minority Carrier
◽
Direct Determination
◽
Minority Carrier Lifetime
◽
Metal Oxide Semiconductor
◽
Oxide Semiconductor
◽
Capacitance Measurements
◽
Semiconductor Structures
◽
Transient Capacitance
Download Full-text
Quantitative Characterization of Near-Interface Oxide Traps in 4H-SiC MOS Capacitors by Transient Capacitance Measurements
ECS Transactions
◽
10.1149/06905.0219ecst
◽
2015
◽
Vol 69
(5)
◽
pp. 219-225
◽
Cited By ~ 3
Author(s):
Y. Fujino
◽
K. Kita
Keyword(s):
Quantitative Characterization
◽
Mos Capacitors
◽
Capacitance Measurements
◽
Transient Capacitance
◽
Oxide Traps
Download Full-text
Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈1̄1̄1̄〉 and 〈100〉 orientations
Surface Science
◽
10.1016/0039-6028(84)90541-7
◽
1984
◽
Vol 143
(2-3)
◽
pp. L417-L420
◽
Cited By ~ 6
Author(s):
A.M. Narsale
◽
B.M. Arora
Keyword(s):
Deep Level
◽
Native Oxide
◽
Transient Capacitance
◽
Capacitance Spectroscopy
Download Full-text
Deep level transient capacitance spectroscopy of defects at native oxide-GaAs interfaces of 〈〉 and 〈100〉 orientations
Surface Science Letters
◽
10.1016/0167-2584(84)90634-0
◽
1984
◽
Vol 143
(2-3)
◽
pp. L417-L420
Author(s):
A.M. Narsale
◽
B.M. Arora
Keyword(s):
Deep Level
◽
Native Oxide
◽
Transient Capacitance
◽
Capacitance Spectroscopy
Download Full-text
Estimation of near-interface oxide trap density at SiO2/SiC metal-oxide-semiconductor interfaces by transient capacitance measurements at various temperatures
Journal of Applied Physics
◽
10.1063/1.4961871
◽
2016
◽
Vol 120
(8)
◽
pp. 085710
◽
Cited By ~ 20
Author(s):
Yuki Fujino
◽
Koji Kita
Keyword(s):
Metal Oxide
◽
Metal Oxide Semiconductor
◽
Trap Density
◽
Oxide Semiconductor
◽
Capacitance Measurements
◽
Semiconductor Interfaces
◽
Transient Capacitance
◽
Oxide Trap
Download Full-text
Characterization of Near-Interface Oxide Trap Density in SiC MOS Capacitors by Transient Capacitance Measurements at Various Temperatures
10.7567/ssdm.2015.ps-14-10
◽
2015
◽
Author(s):
Y. Fujino
◽
K. Kita
Keyword(s):
Trap Density
◽
Mos Capacitors
◽
Capacitance Measurements
◽
Transient Capacitance
◽
Oxide Trap
Download Full-text
Transient capacitance measurements of laser radiation-induced defects in silicon
Semiconductor Science and Technology
◽
10.1088/0268-1242/5/7/004
◽
1990
◽
Vol 5
(7)
◽
pp. 657-662
◽
Cited By ~ 2
Author(s):
H S Tan
◽
S C Ng
◽
H S Woon
◽
G Hultquist
Keyword(s):
Laser Radiation
◽
Capacitance Measurements
◽
Radiation Induced
◽
Transient Capacitance
◽
Induced Defects
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TRANSIENT CAPACITANCE MEASUREMENTS OF ELECTRONIC STATES AT THE SiO2-Si INTERFACE
The Physics of SiO2 and its Interfaces
◽
10.1016/b978-0-08-023049-8.50078-6
◽
1978
◽
pp. 421-427
◽
Cited By ~ 23
Author(s):
N.M. Johnson
◽
D.J. Bartelink
◽
M. Schulz
Keyword(s):
Electronic States
◽
Capacitance Measurements
◽
Transient Capacitance
Download Full-text
Quantitative Characterization of Near-Interface Oxide Traps in 4H-SiC MOS Capacitors by Transient Capacitance Measurements
ECS Meeting Abstracts
◽
10.1149/ma2015-02/18/835
◽
2015
◽
Keyword(s):
Quantitative Characterization
◽
Mos Capacitors
◽
Capacitance Measurements
◽
Transient Capacitance
◽
Oxide Traps
Download Full-text
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