Scanning force microscopy application to polymer surfaces for novel nanoscale surface characterization

1996 ◽  
Vol 273 (1-2) ◽  
pp. 304-307 ◽  
Author(s):  
Makoto Motomatsu ◽  
Heng-Yong Nie ◽  
Wataru Mizutani ◽  
Hiroshi Tokumoto
Keyword(s):  
Surface Characterization ◽  
Scanning Force Microscopy ◽  
Polymer Surfaces ◽  
Force Microscopy ◽  
Scanning Force

Nanometer-Scale Modification and Imaging of Polyimide Films by Scanning Force Microscopy

1991 ◽  
Vol 239 ◽  
Author(s):  
W. N. Unertl ◽  
X. Jin
Keyword(s):  
Scanning Force Microscopy ◽  
Polymer Surfaces ◽  
Degree Of Crystallinity ◽  
Nanometer Scale ◽  
Polyimide Films ◽  
Scanning Force Microscope ◽  
Force Microscopy ◽  
Scanning Force ◽  
Micrometer Size ◽  
The Degree Of Crystallinity

ABSTRACTThe sharp tip of a scanning force microscope can be used to make controlled modifications of polymer surfaces. In this paper, we describe the properties of micrometer size pits up to 900 Å deep formed on Kapton-H surfaces. The structure at the bottom of the pits appears to be closely related to the degree of crystallinity near the surface. We also use elasticity theory to estimate that the resolution of scanning force microscopy for polymer surfaces is about 160 Å for tips with 400 Å radius. This estimate agrees well with the resolution obtained in images of polyimide surfaces.

Investigation of polymer surfaces using scanning force microscopy (SFM) “a new direct look on old polymer problems”

1992 ◽  
Vol 62 (1) ◽  
pp. 141-155 ◽  
Author(s):  
P.C.M. Grim ◽  
H. J. Brouwer ◽  
R. M. Seyger ◽  
G. T. Oostergetel ◽  
W.G. Bergsma Schutter ◽  
...  
Keyword(s):  
Scanning Force Microscopy ◽  
Polymer Surfaces ◽  
Force Microscopy ◽  
Scanning Force
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