Transmission electron microscopy study of ion implantation induced Si amorphization

Nuclear Instruments and Methods in Physics Research ◽

10.1016/0167-5087(83)90822-0 ◽

1983 ◽

Vol 209-210 ◽

pp. 351-356 ◽

Author(s):

M.O. Ruault ◽

J. Chaumont ◽

H. Bernas

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A transmission electron microscopy study of the effect of the ? ? ? phase transformation of tin on xenon bubbles formed by ion implantation

Journal of Materials Science Letters ◽

10.1007/bf00724777 ◽

1991 ◽

Vol 10 (15) ◽

pp. 905-907 ◽

Author(s):

D. R. G. Mitchell ◽

S. E. Donnelly

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Phase Transformation ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Nucleation and growth of carbon onions synthesized by ion-implantation: a transmission electron microscopy study

Materials Letters ◽

10.1016/s0167-577x(01)00567-5 ◽

2002 ◽

Vol 54 (2-3) ◽

pp. 222-228 ◽

Author(s):

E Thune ◽

T Cabioc'h ◽

Ph Guérin ◽

M.-F Denanot ◽

M Jaouen

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Nucleation And Growth ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron ◽

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Synthesis of mesoporous amorphous silica by Kr and Xe ion implantation: Transmission electron microscopy study of induced nanostructures

Microporous and Mesoporous Materials ◽

10.1016/j.micromeso.2010.02.015 ◽

2010 ◽

Vol 132 (1-2) ◽

pp. 163-173 ◽

Author(s):

E. Oliviero ◽

M.-O. Ruault ◽

B. Décamps ◽

F. Fotuna ◽

E. Ntsoenzok ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Amorphous Silica ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of damage by ion implantation in gold Evidence for a spike threshold

Philosophical Magazine A ◽

10.1080/01418617908239305 ◽

1979 ◽

Vol 39 (6) ◽

pp. 757-783 ◽

Author(s):

M. O. Ruault ◽

H. Bernas ◽

J. Chaumont

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Ion Implantation ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Spike Threshold ◽

Transmission Electron

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High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

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In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Ex Situ ◽

Transmission Electron Microscopy Study ◽

Transmission Electron

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