High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

2002 ◽  
Vol 82 (4) ◽  
pp. 735-749 ◽  
Author(s):  
J. Y.Huang ◽  
B. H. Park ◽  
David Jan ◽  
X. Q. Pan ◽  
Yuntian T. Zhu ◽  
...  
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