Determination of multiple lattice parameters from convergent-beam electron diffraction patterns

1993 ◽  
Vol 50 (1) ◽  
pp. 41-56 ◽  
Author(s):  
S.J. Rozeveld ◽  
J.M. Howe
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Lattice Parameters ◽  
Beam Electron ◽  
Diffraction Patterns ◽  
Convergent Beam

A program for refinement of lattice parameters based on multiple convergent-beam electron diffraction patterns

2007 ◽  
Vol 40 (3) ◽  
pp. 618-622 ◽  
Author(s):  
A. Morawiec
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Lattice Parameters ◽  
Beam Electron ◽  
Dynamical Simulation ◽  
Strain Components ◽  
Diffraction Patterns ◽  
Fitting In ◽  
Convergent Beam ◽  
Elastic Strains

A package of computer programs for refinement of lattice parameters based on convergent-beam electron diffraction (CBED) patterns has been developed. The package is intended to facilitate the measurement of local elastic strains. The strain or lattice parameters are determined by matching experimental and simulated central disks of CBED patterns. The kinematical simulation is used in the primary fitting. In some cases, further refinement by means of dynamical simulation can be applied. User-specified strain components, camera lengths and voltage can be fitted. The software is not limited to any particular material or structure. It is capable of simultaneous matching of multiple patterns originating from the same sample location. The use of a number of different strategies allows for the verification of results and for checking their reliability. Operation of the software is controlledviaa Windows user interface.

A library of convergent-beam electron diffraction patterns

1986 ◽  
Vol 44 ◽  
pp. 688-691
Author(s):  
John F. Mansfield
Keyword(s):  
Electron Diffraction ◽  
Materials Science ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Transmission Electron ◽  
Yield Information ◽  
Analytical Electron ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Electron Energy Loss

One of the most important advancements of the transmission electron microscopy (TEM) in recent years has been the development of the analytical electron microscope (AEM). The microanalytical capabilities of AEMs are based on the three major techniques that have been refined in the last decade or so, namely, Convergent Beam Electron Diffraction (CBED), X-ray Energy Dispersive Spectroscopy (XEDS) and Electron Energy Loss Spectroscopy (EELS). Each of these techniques can yield information on the specimen under study that is not obtainable by any other means. However, it is when they are used in concert that they are most powerful. The application of CBED in materials science is not restricted to microanalysis. However, this is the area where it is most frequently employed. It is used specifically to the identification of the lattice-type, point and space group of phases present within a sample. The addition of chemical/elemental information from XEDS or EELS spectra to the diffraction data usually allows unique identification of a phase.

On the unique evaluation of local lattice parameters by convergent-beam electron diffraction

1996 ◽  
Vol 74 (1) ◽  
pp. 23-43 ◽  
Author(s):  
H. J. Maier ◽  
R. R. Keller ◽  
H. Renner ◽  
H. Mughrabi ◽  
A. Preston
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Lattice Parameters ◽  
Beam Electron ◽  
Local Lattice ◽  
Convergent Beam

Determination of space group of BaPb0.75Bi0.25O3 by convergent-beam electron diffraction

2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films

1999 ◽  
Vol 589 ◽  
Author(s):  
C. Schuer ◽  
M. Leicht ◽  
T. Marek ◽  
H.P. Strunk
Keyword(s):  
Electron Diffraction ◽  
High Sensitivity ◽  
Diffraction Theory ◽  
Gaas Layer ◽  
Convergent Beam Electron Diffraction ◽  
Epitaxial Films ◽  
Tetragonal Distortion ◽  
Beam Electron ◽  
Convergent Beam

AbstractWe have optimized the sensitivity of convergent beam electron diffraction (CBED) by orienting the specimen such that the central (000) diffraction disc shows a pattern of defect lines that are most sensitive to tetragonal distortion. We compare the position of these lines in the experimentally obtained patterns with results from computer simulations, which need to be based on dynamical diffraction theory. In both experimental and simulated patterns the positions of the defect lines are determined by applying a Hough transformation. As a result of this optimized approach, we can measure the tetragonal distortion of a low temperature grown GaAs layer as low as 0.04%.

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