scholarly journals Determination of Strain Relaxation at the Free Surfce of Strained-SiGe Film Using Convergent Beam Electron Diffraction

2005 ◽  
Vol 11 (S02) ◽  
Author(s):  
S-I Baik ◽  
Y-W Kim
Keyword(s):  
Electron Diffraction ◽  
Strain Relaxation ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Convergent Beam ◽  
Strained Sige

Determination of space group of BaPb0.75Bi0.25O3 by convergent-beam electron diffraction

2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films

1999 ◽  
Vol 589 ◽  
Author(s):  
C. Schuer ◽  
M. Leicht ◽  
T. Marek ◽  
H.P. Strunk
Keyword(s):  
Electron Diffraction ◽  
High Sensitivity ◽  
Diffraction Theory ◽  
Gaas Layer ◽  
Convergent Beam Electron Diffraction ◽  
Epitaxial Films ◽  
Tetragonal Distortion ◽  
Beam Electron ◽  
Convergent Beam

AbstractWe have optimized the sensitivity of convergent beam electron diffraction (CBED) by orienting the specimen such that the central (000) diffraction disc shows a pattern of defect lines that are most sensitive to tetragonal distortion. We compare the position of these lines in the experimentally obtained patterns with results from computer simulations, which need to be based on dynamical diffraction theory. In both experimental and simulated patterns the positions of the defect lines are determined by applying a Hough transformation. As a result of this optimized approach, we can measure the tetragonal distortion of a low temperature grown GaAs layer as low as 0.04%.

Space Group Determination of the Room-Temperature Phase ofα '-NaV2O5Using Convergent-Beam Electron Diffraction

2000 ◽  
Vol 69 (7) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Room Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Temperature Phase ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Space Group Determination of Decagonal Quasicrystals of an Al70Ni15Fe15Alloy Using Convergent-Beam Electron Diffraction

1992 ◽  
Vol 31 (Part 2, No. 2A) ◽  
pp. L109-L112 ◽  
Author(s):  
Masakazu Saito ◽  
Michiyoshi Tanaka ◽  
An Pang Tsai ◽  
Akihisa Inoue ◽  
Tsuyoshi Masumoto
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Decagonal Quasicrystals ◽  
Convergent Beam

Determination of γ/γ interface types in a γ-TiAl alloy using convergent beam electron diffraction

2002 ◽  
Vol 47 (11) ◽  
pp. 757-762 ◽  
Author(s):  
S.H Chen ◽  
G Schumacher ◽  
D Mukherji ◽  
G Frohberg ◽  
R.P Wahi
Keyword(s):  
Electron Diffraction ◽  
Tial Alloy ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Convergent Beam

scholarly journals Determination of As and Ga planes by convergent beam electron diffraction

1986 ◽  
Vol 49 (18) ◽  
pp. 1190-1192 ◽  
Author(s):  
Z. Liliental‐Weber ◽  
L. Parechanian‐Allen
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Convergent Beam

scholarly journals Determination of structure factors of copper by convergent beam electron diffraction

1993 ◽  
Vol 51 ◽  
pp. 688-689
Author(s):  
John Mansfield ◽  
Martin Saunders ◽  
George Burgess ◽  
David Bird ◽  
Nestor Zaluzec
Keyword(s):  
Electron Diffraction ◽  
National Laboratory ◽  
Pure Copper ◽  
Argonne National Laboratory ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Structure Factors ◽  
Convergent Beam ◽  
Ray Methods

There has been considerable recent interest in the determination of structure factors from convergent-beam electron diffraction (CBED) patterns and the ultimate goal is the ability to retrieve the crystal structure of an unknown crystal by inversion of a CBED pattern. There are a number of different methods that have been used to extract structure factor information. The zone-axis pattern fitting technique of Bird and Saunders has recently been used to obtain structure factors for silicon that compare well with those obtained by X-ray methods. This work extends the techniques to f.c.c. metals, specifically copper.CBED patterns were recorded from [110] zone axes of electropolished foils of pure copper (99.999% purity) in the Philips EM420T at Argonne National Laboratory. The patterns were energy-filtered by scanning the whole pattern across the entrance aperture of a Gatan #607 serial energy loss spectrometer and collecting the zero loss intensity only (energy window ∼5eV).

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