Superplastic deformation and electric field assisted joining of advanced ceramics

2022 ◽  
pp. 527-553
Author(s):  
Yufei Zu ◽  
Kang Wang ◽  
Qi Wang ◽  
Zhifan Wei ◽  
Guoqing Chen
Keyword(s):  
Electric Field ◽  
Superplastic Deformation ◽  
Advanced Ceramics

Superplastic deformation of duralumin LY12CZ under an electric field

1994 ◽  
Vol 40 (3-4) ◽  
pp. 385-393 ◽  
Author(s):  
Miaoquan Li ◽  
Yuli Liu ◽  
Shichun Wu ◽  
Xiaowei Wu
Keyword(s):  
Electric Field ◽  
Superplastic Deformation

Resolution in photoelectron microscopy

1991 ◽  
Vol 49 ◽  
pp. 458-459
Author(s):  
G. F. Rempfer
Keyword(s):  
Electron Microscopy ◽  
Electric Field ◽  
Ultraviolet Light ◽  
Uniform Field ◽  
Virtual Image ◽  
Lens System ◽  
Photoemission Electron Microscopy ◽  
Planar Electrode ◽  
Electron Lens ◽  
Photoemission Electron

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.

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