Nonlinear dynamics of proton beams with hollow electron lens in the CERN high-luminosity LHC

The design stored beam energy in the CERN high-luminosity large hadron collider (HL-LHC) upgrade is about 700 MJ, with about 36 MJ in the beam tails, according to estimates based on scaling considerations from measurements at the LHC. Such a large amount of stored energy in the beam tails poses serious challenges on its control and safe disposal. In particular, orbit jitters can cause significant losses on primary collimators, which can lead to accidental beam dumps, magnet quenches, or even permanent damage to collimators and other accelerator elements. Thus, active control of the diffusion speed of halo particles is necessary and the use of hollow electron lenses (HELs) represents the most promising approach to handle overpopulated tails at the HL-LHC. HEL is a very powerful and advanced tool that can be used for controlled depletion of beam tails, thus enhancing the performance of beam halo collimation. For these reasons, HELs have been recently included in the HL-LHC baseline. In this paper, we present detailed beam dynamics calculations performed with the goal of defining HEL specifications and operational scenarios for HL-LHC. The prospects for effective halo control in HL-LHC are presented.

Soft X-ray ARPES for three-dimensional crystals in the micrometre region

An endstation dedicated to angle-resolved photoemission spectroscopy (ARPES) using a soft X-ray microbeam has been developed at the beamline BL25SU of SPring-8. To obtain a high photoemission intensity, this endstation is optimized for measurements under the condition of grazing beam incidence to a sample surface, where the glancing angle is 5° or smaller. A Wolter mirror is used for focusing the soft X-rays. Even at the glancing angle of 5°, the smallest beam spot still having a sufficient photon flux for ARPES is almost round on the sample surface and the FWHM diameter is ∼5 µm. There is no need to change the sample orientation for performing k x − k y mapping by virtue of the electron lens with a deflector of the photoelectron analyzer, which makes it possible to keep the irradiation area unchanged. A partially cleaved surface area as small as ∼20 µm was made on an Si(111) wafer and ARPES measurements were performed. The results are presented.

Raman Scattering Study on the Influence of E-Beam Bombardment on Si Electron Lens

Microcolumns have a stacked structure composed of an electron emitter, electron lens (source lens), einzel lens, and a deflector manufactured using a micro electro-mechanical system process. The electrons emitted from the tungsten field emitter mostly pass through the aperture holes. However, other electrons fail to pass through because of collisions around the aperture hole. We used Raman scattering measurements and X-ray photoelectron spectroscopy analyses to investigate the influence of electron beam bombardment on a Si electron lens irradiated by acceleration voltages of 0, 20, and 30 keV. We confirmed that the crystallinity was degraded, and carbon-related contamination was detected at the surface and edge of the aperture hole of the Si electron lens after electron bombardment for 24 h. Carbon-related contamination on the surface of the Si electron lens was verified by analyzing the Raman spectra of the carbon-deposited Si substrate using DC sputtering and a carbon rod sample. We report the crystallinity and the origin of the carbon-related contamination of electron Si lenses after electron beam bombardment by non-destructive Raman scattering and XPS analysis methods.