Characterization of single-crystalline Cu/Nb multilayer films by ion beam analysis
2004 ◽
Vol 22
(3)
◽
pp. 908
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2005 ◽
Vol 240
(1-2)
◽
pp. 371-375
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2000 ◽
Vol 170
(3-4)
◽
pp. 461-466
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2002 ◽
Vol 153
(1)
◽
pp. 10-15
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1987 ◽
Vol 28
(2)
◽
pp. 284-288
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1983 ◽
Vol 218
(1-3)
◽
pp. 579-583
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