Application of ion beam analysis to the characterization of protective coatings prepared by plasma detonation techniques on steel samples

2005 ◽  
Vol 240 (1-2) ◽  
pp. 371-375 ◽  
Author(s):  
P. Misaelides ◽  
F. Noli ◽  
Y.N. Tyurin ◽  
A.D. Pogrebnjak ◽  
G. Perdikakis
Keyword(s):  
Protective Coatings ◽  
Ion Beam ◽  
Ion Beam Analysis ◽  
Beam Analysis

scholarly journals Application of ion beam analysis for the characterization of SiC- and DLC-thin films

2020 ◽  
Vol 15 ◽  
pp. 269
Author(s):  
F. Noli ◽  
P. Misaelides ◽  
M. Kokkoris ◽  
J. P. Riviere
Keyword(s):  
Thin Films ◽  
Silicon Carbide ◽  
Rutherford Backscattering Spectrometry ◽  
Protective Coatings ◽  
Ion Beam ◽  
Ion Beam Analysis ◽  
Silicon Carbon ◽  
Beam Analysis

Three series of protective coatings (thickness ca. 200-300 nm) were prepared on the surface of Ti-Al-V alloy (TA6V): silicon carbide (SiC) films produced by ion sputtering (I), silicon carbide films and subjected to Dynamic Ion Mixing (DIM) during the deposition procedure (II) and Diamond Like Carbon (DLC) films produced by ion beam deposition (III). The chemical composition (Si, C and O) of the films was determined using ion beam analysis techniques. The silicon, carbon and oxygen depth distribution was determined by proton Rutherford backscattering spectrometry (p-RBS) and using the resonances at 4.265 and 3.035 MeV of the 12C(α,α)12C and 16O(α,α)16O interactions respectively. The ratio of Si:C was found to be close to the stoichiometric one. The corrosion resistance of the coated samples was tested under strong aggressive conditions (5M HCl at 50 oC). The investigation following the corrosion attack showed that the thickness of the films remained practically unchanged. Only slight diffusion and dissolution effects were observed indicating the good quality of the produced thin films.

Characterization of GaAs[sub 1−x]N[sub x] epitaxial layers by ion beam analysis

2004 ◽  
Vol 22 (3) ◽  
pp. 908 ◽  
Author(s):  
P. Wei ◽  
M. Chicoine ◽  
S. Gujrathi ◽  
F. Schiettekatte ◽  
J.-N. Beaudry ◽  
...  
Keyword(s):  
Ion Beam ◽  
Epitaxial Layers ◽  
Ion Beam Analysis ◽  
Beam Analysis

In situ characterization of rare earth-CdTe heterostructures by ion beam analysis

1994 ◽  
Vol 249 (2) ◽  
pp. 266-270 ◽  
Author(s):  
P Gros ◽  
G Fiat ◽  
D Brun ◽  
B Daudin ◽  
J Eymery ◽  
...  
Keyword(s):  
Rare Earth ◽  
Ion Beam ◽  
In Situ Characterization ◽  
Ion Beam Analysis ◽  
Beam Analysis

Characterization of silicon oxynitride films using ion beam analysis techniques

2000 ◽  
Vol 170 (3-4) ◽  
pp. 461-466 ◽  
Author(s):  
S.R Walker ◽  
J.A Davies ◽  
P Mascher ◽  
S.G Wallace ◽  
W.N Lennard ◽  
...  
Keyword(s):  
Ion Beam ◽  
Silicon Oxynitride ◽  
Ion Beam Analysis ◽  
Analysis Techniques ◽  
Beam Analysis

Ion beam analysis techniques and characterization of amorphous hydrogenated GaAs

1983 ◽  
Vol 218 (1-3) ◽  
pp. 579-583 ◽  
Author(s):  
J.P. Thomas ◽  
M. Fallavier ◽  
H. Carchano ◽  
L. Alimoussa
Keyword(s):  
Ion Beam ◽  
Ion Beam Analysis ◽  
Analysis Techniques ◽  
Beam Analysis

scholarly journals Meso-scale characterization of lithium distribution in lithium-ion batteries using ion beam analysis techniques

2015 ◽  
Vol 299 ◽  
pp. 587-595 ◽  
Author(s):  
R. Gonzalez-Arrabal ◽  
M. Panizo-Laiz ◽  
K. Fujita ◽  
K. Mima ◽  
A. Yamazaki ◽  
...  
Keyword(s):  
Lithium Ion Batteries ◽  
Ion Beam ◽  
Lithium Ion ◽  
Ion Beam Analysis ◽  
Analysis Techniques ◽  
Beam Analysis ◽  
Scale Characterization ◽  
Meso Scale
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