Abnormal grain growth of Goss grains in Fe–3% Si steel driven by sub-boundary-enhanced solid-state wetting: Analysis by Monte Carlo simulation

2010 ◽  
Vol 58 (13) ◽  
pp. 4414-4423 ◽  
Author(s):  
Kyung-Jun Ko ◽  
Anthony D. Rollett ◽  
Nong-Moon Hwang
2012 ◽  
Vol 715-716 ◽  
pp. 146-151
Author(s):  
K.J. Ko ◽  
A.D. Rollett ◽  
N.M. Hwang

The selective abnormal grain growth (AGG) of Goss grains in Fe-3%Si steel was investigated using a parallel Monte-Carlo (MC) simulation based on the new concept of sub-boundary enhanced solid-state wetting. Goss grains with low angle sub-boundaries will induce solid-state wetting against matrix grains with a moderate variation in grain boundary energy. Three-dimensional MC simulations of microstructure evolution with textures and grain boundary distributions matched to experimental data is using in this study.


2013 ◽  
Vol 753 ◽  
pp. 367-372
Author(s):  
Tae Wook Na ◽  
Chang Soo Park ◽  
Hyung Seok Shim ◽  
Byeong Joo Lee ◽  
Chan Hee Han ◽  
...  

Three-dimensional Monte Carlo simulations with real grain orientations are performed to study the role of precipitates and sub-boundaries in the abnormal grain growth. According to the simulation results, sub-boundaries in the abnormally growing grain and precipitates in the matrix grains are necessary for the abnormal grain growth. The simulation results can be best explained by the mechanism of sub-boundary enhanced solid state wetting. The simulated microstructure is very similar to that experimentally observed.


2001 ◽  
Vol 308 (1-2) ◽  
pp. 258-267 ◽  
Author(s):  
René Messina ◽  
Michèle Soucail ◽  
Ladislas Kubin

2012 ◽  
Vol 66 (6) ◽  
pp. 398-401 ◽  
Author(s):  
Chang-Soo Park ◽  
Tae-Wook Na ◽  
Hyung-Ki Park ◽  
Byeong-Joo Lee ◽  
Chan-Hee Han ◽  
...  

1999 ◽  
Vol 2 (3) ◽  
pp. 133-137 ◽  
Author(s):  
Paulo Blikstein ◽  
André Paulo Tschiptschin

Author(s):  
Y. J. Cho ◽  
J. W. Jang ◽  
G. H. Jang

We proposed a method to estimate a distribution of fatigue life of solid state drives (SSDs) due to thermal cycling excitation by using finite element method and Monte Carlo simulation. In the developed finite element model, we utilized the Anand model to represent the viscoplastic behavior of the solder balls, and we also utilized the Prony series to represent the viscoelastic behavior of the polymer material in underfill. We determined a fatigue life of the SSD by using the Morrow’s energy-based fatigue model. Finally, we determined a distribution of fatigue life considering the manufacturing tolerance of the design variables and the variation of material properties in the Monte Carlo simulation. Finite element analysis shows that the outermost solder ball at the corner of dynamic random access memory was the most vulnerable component under the thermal cycling excitation. We also show that temperature profile and diameter of solder ball affect dominantly the fatigue life of the SSD.


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