scholarly journals Response to Letter to the Editor on “High Incidence of Irradiated Cortical Strut Allograft Resorption Following Revision of Femoral Stems”

2021 ◽  
Vol 36 (4) ◽  
pp. e24-e25
Author(s):  
Imran Ilyas ◽  
Omar A. Al-Mohrej
Keyword(s):  
Letter To The Editor ◽  
High Incidence ◽  
Femoral Stems ◽  
Cortical Strut

Letter To The Editor

PEDIATRICS ◽  
1970 ◽  
Vol 45 (1) ◽  
pp. 155-155
Author(s):  
Judith M. Chessells ◽  
W. R. Pitney
Keyword(s):  
Cord Blood ◽  
Hemagglutination Inhibition ◽  
Sodium Citrate ◽  
Newborn Infants ◽  
Caproic Acid ◽  
Healthy Newborn ◽  
Letter To The Editor ◽  
High Incidence ◽  
Inhibition Technique

Drs. Stiehm and Clatanoff (Pediatrics, 43: 770, 1969) report a high incidence of split products of fibrin (SPF) in the cord blood of healthy newborn infants. This is contrary to our own experience which had indicated the presence of SPF in only 5% of healthy newborns. We use a hemagglutination inhibition technique which is at least as sensitive as the tube precipitin assay employed by Drs. Stiehm and Clatanoff. The two methods differ in one important aspect, however; we have tested cord blood drawn into a mixture of sodium citrate and epsilon amino-caproic acid to inhibit in vitro fibrinolysis.

Response to Letter to the Editor on “Breaking Bad: A Comparative Descriptive Analysis of Periprosthetic Fractures Around Cemented and Uncemented Femoral Stems”

2020 ◽  
Vol 35 (1) ◽  
pp. 302
Author(s):  
Christopher Fenelon ◽  
Evelyn P. Murphy ◽  
Muhammad N. Baig ◽  
Stephen R. Kearns ◽  
Colin G. Murphy ◽  
...  
Keyword(s):  
Descriptive Analysis ◽  
Periprosthetic Fractures ◽  
Breaking Bad ◽  
Letter To The Editor ◽  
Femoral Stems

The observation of defects on (100) CdTe surfaces by chemical etching

1992 ◽  
Vol 50 (2) ◽  
pp. 1424-1425
Author(s):  
M.E. Lee
Keyword(s):  
Single Crystal ◽  
Grain Boundaries ◽  
Single Crystals ◽  
Chemical Etching ◽  
Crystalline Perfection ◽  
Crystalline Defects ◽  
High Incidence ◽  
Crystallographic Defects ◽  
Cdznte Substrates ◽  
Device Technology

The crystalline perfection of bulk CdTe substrates plays an important role in their use in infrared device technology. The application of chemical etchants to determine crystal polarity or the density and distribution of crystallographic defects in (100) CdTe is not well understood. The lack of data on (100) CdTe surfaces is a result of the apparent difficulty in growing (100) CdTe single crystal substrates which is caused by a high incidence of twinning. Many etchants have been reported to predict polarity on one or both (111) CdTe planes but are considered to be unsuitable as defect etchants. An etchant reported recently has been considered to be a true defect etchant for CdTe, MCT and CdZnTe substrates. This etchant has been reported to reveal crystalline defects such as dislocations, grain boundaries and inclusions in (110) and (111) CdTe. In this study the effect of this new etchant on (100) CdTe surfaces is investigated.The single crystals used in this study were (100) CdTe as-cut slices (1mm thickness) from Bridgman-grown ingots.

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