Failure analysis of M250 maraging steel stud used in Flex Nozzle Control actuator bracket of solid propulsion system

2011 ◽  
Vol 18 (3) ◽  
pp. 1128-1133 ◽  
Author(s):  
Abhay K. Jha ◽  
M. Swathi Kiranmayee ◽  
K. Sreekumar ◽  
P.P. Sinha
2013 ◽  
Vol 27 ◽  
pp. 308-313 ◽  
Author(s):  
Abhay K. Jha ◽  
M. Swathi Kiranmayee ◽  
Sushant K. Manwatkar

2018 ◽  
Vol 5 (9) ◽  
pp. 535-547
Author(s):  
Elham Keshavarzi ◽  
◽  
Kai Goebel ◽  
Irem Y. Tumer ◽  
Christopher Hoyle ◽  
...  

2009 ◽  
Vol 16 (1) ◽  
pp. 552-557 ◽  
Author(s):  
S.S.M. Tavares ◽  
J.S. Corte ◽  
C.A.B. Menezes ◽  
L. Menezes ◽  
V. Moura ◽  
...  

1984 ◽  
Vol 75 ◽  
pp. 743-759 ◽  
Author(s):  
Kerry T. Nock

ABSTRACTA mission to rendezvous with the rings of Saturn is studied with regard to science rationale and instrumentation and engineering feasibility and design. Future detailedin situexploration of the rings of Saturn will require spacecraft systems with enormous propulsive capability. NASA is currently studying the critical technologies for just such a system, called Nuclear Electric Propulsion (NEP). Electric propulsion is the only technology which can effectively provide the required total impulse for this demanding mission. Furthermore, the power source must be nuclear because the solar energy reaching Saturn is only 1% of that at the Earth. An important aspect of this mission is the ability of the low thrust propulsion system to continuously boost the spacecraft above the ring plane as it spirals in toward Saturn, thus enabling scientific measurements of ring particles from only a few kilometers.


Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


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