Single antiferromagnetic axis of Fe in orthorhombic YMn0.5Fe0.5O3 films observed by x-ray magnetic linear dichroism

2019 ◽  
Vol 780 ◽  
pp. 79-84
Author(s):  
Shu Chih Haw ◽  
Chang Yang Kuo ◽  
Zhiwei Hu ◽  
Je Wei Lin ◽  
Jenn Min Lee ◽  
...  
2002 ◽  
Vol 80 (9) ◽  
pp. 1613-1615 ◽  
Author(s):  
S. S. Dhesi ◽  
G. van der Laan ◽  
E. Dudzik

1996 ◽  
Vol 437 ◽  
Author(s):  
G.J. Mankey ◽  
K. Subramanian ◽  
R.L. Stockbauer ◽  
R.L. Kurtz

AbstractWe present measurements of the evolution with film thickness of the 3d electronic states at the Fermi energy of ultrathin Ni films. The morphology and thickness of the films is determined from x-ray photoelectron spectroscopy. x-ray photoelectron diffraction and x-ray magnetic linear dichroism using synchrotron radiation. Photoelectron angular distributions were measured using an ellipsoidal mirror analyzer. Even at submonolayer Ni coverages, the 3d electronic states exhibit bulk-like properties. This is attributed to the short screening length of electrons in metals, the localization of the 3d electrons, the similarity of the Ni and Cu ion cores, and finally the interaction with the underlying fcc periodic potential.


2006 ◽  
Vol 73 (2) ◽  
Author(s):  
S. Czekaj ◽  
F. Nolting ◽  
L. J. Heyderman ◽  
P. R. Willmott ◽  
G. van der Laan

1993 ◽  
Vol 86 (10) ◽  
pp. 647-650 ◽  
Author(s):  
Ch. Roth ◽  
H.B. Rose ◽  
F.U. Hillebrecht ◽  
E. Kisker

2002 ◽  
Vol 2 (4) ◽  
pp. 238-239 ◽  
Author(s):  
K. Sato ◽  
Y. Ueji ◽  
K. Okitsu ◽  
T. Matsushita ◽  
J. Saito ◽  
...  

2014 ◽  
Vol 368 ◽  
pp. 364-373 ◽  
Author(s):  
M. Emmel ◽  
A. Alfonsov ◽  
D. Legut ◽  
A. Kehlberger ◽  
E. Vilanova ◽  
...  

2006 ◽  
Vol 73 (21) ◽  
Author(s):  
J. Fujii ◽  
F. Borgatti ◽  
G. Panaccione ◽  
M. Hochstrasser ◽  
F. Maccherozzi ◽  
...  

2007 ◽  
Vol 98 (19) ◽  
Author(s):  
Elke Arenholz ◽  
Gerrit van der Laan ◽  
Rajesh V. Chopdekar ◽  
Yuri Suzuki

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