All-optical patterning in azobenzene polymers and amorphous chalcogenides

2019 ◽  
Vol 512 ◽  
pp. 112-131 ◽  
Author(s):  
Volodymyr M. Kryshenik ◽  
Yuriy M. Azhniuk ◽  
Victor S. Kovtunenko
Keyword(s):  
Amorphous Chalcogenides ◽  
All Optical ◽  
Optical Patterning

scholarly journals Diffractive-Optical Elements via All-Optical Patterning of Photopolymers and Nanocomposites

2010 ◽  
Vol 23 (6) ◽  
pp. 757-764 ◽  
Author(s):  
Oksana V. Sakhono ◽  
Joachim Stumpe ◽  
Leonid M. Goldenberg ◽  
Tatiana N. Smirnova ◽  
Lyudmila M. Kokhtych
Keyword(s):  
Diffractive Optical Elements ◽  
Optical Elements ◽  
All Optical ◽  
Optical Patterning

All-Optical Patterning of Au Nanoparticles on Surfaces Using Optical Traps

Nano Letters ◽  
2010 ◽  
Vol 10 (11) ◽  
pp. 4302-4308 ◽  
Author(s):  
Mason J. Guffey ◽  
Norbert F. Scherer
Keyword(s):  
Au Nanoparticles ◽  
Optical Traps ◽  
All Optical ◽  
Optical Patterning

All-optical patterning of azo polymer films

2001 ◽  
Vol 5 (6) ◽  
pp. 487-494 ◽  
Author(s):  
Kevin G. Yager ◽  
Christopher J. Barrett
Keyword(s):  
Polymer Films ◽  
Azo Polymer ◽  
All Optical ◽  
Optical Patterning

Correlation analysis of radiation damage

1978 ◽  
Vol 36 (1) ◽  
pp. 214-215
Author(s):  
R. Hegerl ◽  
A. Feltynowski ◽  
B. Grill
Keyword(s):  
Electron Microscopy ◽  
Independent Random Variables ◽  
Optical Parameters ◽  
Bright Field Image ◽  
Bright Field ◽  
Expectation Value ◽  
All Optical ◽  
Image Element ◽  
Stochastic Series ◽  
The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

ALL-OPTICAL DIGITAL CIRCUITS

1988 ◽  
Vol 49 (C2) ◽  
pp. C2-459-C2-462 ◽  
Author(s):  
F. A.P. TOOLEY ◽  
B. S. WHERRETT ◽  
N. C. CRAFT ◽  
M. R. TAGHIZADEH ◽  
J. F. SNOWDON ◽  
...  
Keyword(s):  
Digital Circuits ◽  
All Optical
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