Microstructural characterization of recrystallised Zircaloy-2 after pilgering using X-ray diffraction line profile analysis

Journal of Nuclear Materials ◽

10.1016/j.jnucmat.2012.11.028 ◽

2013 ◽

Vol 434 (1-3) ◽

pp. 24-30 ◽

Author(s):

P. Mukherjee ◽

N. Gayathri ◽

P.S. Chowdhury ◽

M.K. Mitra

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Microstructural Characterization ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.69.421 ◽

2020 ◽

Vol 69 (5) ◽

pp. 421-426

Author(s):

Masayuki NISHIDA ◽

Tadafumi HASHIMOTO ◽

Masayoshi KUMAGAI

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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Characterization of Irradiated Microstructure by X-Ray Diffraction Line Profile Analysis

Metallurgical and Materials Transactions A ◽

10.1007/s11661-007-9428-7 ◽

2008 ◽

Vol 39 (7) ◽

pp. 1602-1609 ◽

Author(s):

A. Sarkar ◽

P. Mukherjee ◽

P. Barat

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.69.343 ◽

2020 ◽

Vol 69 (4) ◽

pp. 343-347 ◽

Author(s):

Takahisa SHOBU ◽

Ayumi SHIRO ◽

Yutaka YOSHIDA

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

Journal of the Society of Materials Science Japan ◽

10.2472/jsms.69.277 ◽

2020 ◽

Vol 69 (3) ◽

pp. 277-283 ◽

Author(s):

Masayoshi KUMAGAI ◽

Ryoichi YOKOYAMA

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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Characterization of the microstructure of deformed Al-Zn-Cu alloys by X-ray diffraction line profile analysis

Metallurgical and Materials Transactions A ◽

10.1007/bf02649099 ◽

1995 ◽

Vol 26 (4) ◽

pp. 1011-1013

Author(s):

Hiranmay Pal ◽

S. K. Pradhan ◽

M. De

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

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Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis

Thin Solid Films ◽

10.1016/s0040-6090(98)00366-6 ◽

1998 ◽

Vol 324 (1-2) ◽

pp. 162-164 ◽

Author(s):

F.L Shan ◽

Z.M Gao ◽

Y.M Wang

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

Multilayered Films ◽

X Ray ◽

Diffraction Line Profile

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Appendix: characterisation of defect structure by x-ray diffraction line profile analysis

Defect Structure in Nanomaterials ◽

10.1533/9780857096142.333 ◽

2012 ◽

pp. 333-353

Keyword(s):

Line Profile ◽

Defect Structure ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

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X-ray diffraction line profile analysis of diffusional homogenization in powder blends

Journal of Materials Science ◽

10.1007/bf00548730 ◽

1978 ◽

Vol 13 (8) ◽

pp. 1671-1679 ◽

Author(s):

R. Delhez ◽

E. J. Mittemeijer ◽

E. A. van den Bergen

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile ◽

Powder Blends ◽

Diffusional Homogenization

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X-ray diffraction line profile analysis of mechanically alloyed nanocrystalline YSZ

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/41/4/045408 ◽

2008 ◽

Vol 41 (4) ◽

pp. 045408 ◽

Author(s):

O J Durá ◽

M A López de la Torre

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

Mechanically Alloyed ◽

X Ray ◽

Diffraction Line Profile

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X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

Bulletin of Materials Science ◽

10.1007/bf02708487 ◽

2004 ◽

Vol 27 (1) ◽

pp. 59-67 ◽

Author(s):

K. Kapoor ◽

D. Lahiri ◽

S. V. R. Rao ◽

T. Sanyal ◽

B. P. Kashyap

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Diffraction Line ◽

Line Profile Analysis ◽

X Ray Diffraction ◽

X Ray ◽

Diffraction Line Profile

Download Full-text