scholarly journals Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

2020 ◽  
Vol 69 (4) ◽  
pp. 343-347 ◽  
Author(s):  
Takahisa SHOBU ◽  
Ayumi SHIRO ◽  
Yutaka YOSHIDA
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

scholarly journals Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

2020 ◽  
Vol 69 (5) ◽  
pp. 421-426
Author(s):  
Masayuki NISHIDA ◽  
Tadafumi HASHIMOTO ◽  
Masayoshi KUMAGAI
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

scholarly journals Characterization of Irradiated Microstructure by X-Ray Diffraction Line Profile Analysis

2008 ◽  
Vol 39 (7) ◽  
pp. 1602-1609 ◽  
Author(s):  
A. Sarkar ◽  
P. Mukherjee ◽  
P. Barat
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

scholarly journals Characterization of Microstructures by X-Ray Diffraction Line Profile Analysis

2020 ◽  
Vol 69 (3) ◽  
pp. 277-283 ◽  
Author(s):  
Masayoshi KUMAGAI ◽  
Ryoichi YOKOYAMA
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile

Microhardness evaluation of Cu–Ni multilayered films by X-ray diffraction line profile analysis

1998 ◽  
Vol 324 (1-2) ◽  
pp. 162-164 ◽  
Author(s):  
F.L Shan ◽  
Z.M Gao ◽  
Y.M Wang
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
Multilayered Films ◽  
X Ray ◽  
Diffraction Line Profile

X-ray diffraction line profile analysis of diffusional homogenization in powder blends

1978 ◽  
Vol 13 (8) ◽  
pp. 1671-1679 ◽  
Author(s):  
R. Delhez ◽  
E. J. Mittemeijer ◽  
E. A. van den Bergen
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile ◽  
Powder Blends ◽  
Diffusional Homogenization

scholarly journals X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Diffraction Line ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Line Profile
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