scholarly journals Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization

2004 ◽  
Vol 145 (1-2) ◽  
pp. 123-141 ◽  
Author(s):  
V Singh
2017 ◽  
Vol 11 ◽  
Author(s):  
Diego Castillo-Barnes ◽  
Ignacio Peis ◽  
Francisco J. Martínez-Murcia ◽  
Fermín Segovia ◽  
Ignacio A. Illán ◽  
...  

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