Image segmentation for automatic particle identification in electron micrographs based on hidden Markov random field models and expectation maximization
2004 ◽
Vol 145
(1-2)
◽
pp. 123-141
◽
2017 ◽
Keyword(s):
2017 ◽
Vol 85
◽
pp. 49-55
◽
2018 ◽
Vol 6
(1)
◽
pp. 3273-3281
Keyword(s):