Polarity determination of ferroelectric LiNbO3 crystals and BiFeO3 thin films by the convergent beam electron diffraction technique

2010 ◽  
Vol 61 (9) ◽  
pp. 859-865 ◽  
Author(s):  
Chao Guo ◽  
Huamin Zou ◽  
Shizhou Pu ◽  
Meiya Li ◽  
Jiefeng Cao
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Bifeo3 Thin Films ◽  
Electron Diffraction Technique ◽  
Polarity Determination ◽  
Convergent Beam

scholarly journals Sensitivity of quantitative symmetry measurement algorithms for convergent beam electron diffraction technique

2021 ◽  
Vol 51 (1) ◽  
Author(s):  
Hyeongsub So ◽  
Ro Woon Lee ◽  
Sung Taek Hong ◽  
Kyou-Hyun Kim
Keyword(s):  
Electron Diffraction ◽  
Cross Correlation ◽  
Structural Changes ◽  
Small Strain ◽  
Convergent Beam Electron Diffraction ◽  
Digital Microscopy ◽  
Beam Electron ◽  
R Factor ◽  
Electron Diffraction Technique ◽  
Convergent Beam

AbstractWe investigate the sensitivity of symmetry quantification algorithms based on the profile R-factor (Rp) and the normalized cross-correlation (NCC) coefficient (γ). A DM (Digital Micrograph©) script embedded in the Gatan digital microscopy software is used to develop the symmetry quantification program. Using the Bloch method, a variety of CBED patterns are simulated and used to investigate the sensitivity of symmetry quantification algorithms. The quantification results show that two symmetry quantification coefficients are significantly sensitive to structural changes even for small strain values of < 1%.

Sign in / Sign up

Export Citation Format

Share Document