On the use of embedded debug features for permanent and transient fault resilience in microprocessors
2012 ◽
Vol 36
(5)
◽
pp. 334-343
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Keyword(s):
2012 ◽
Vol 52
(9-10)
◽
pp. 1781-1786
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Keyword(s):
2011 ◽
Vol 57
(1)
◽
pp. 61-68
◽
2007 ◽
Vol 11
(2-3)
◽
pp. 245-252
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