Automatic system for electron tomography data collection in the ultra-high voltage electron microscope

Micron ◽  
2017 ◽  
Vol 103 ◽  
pp. 29-33
Author(s):  
Meng Cao ◽  
Ryuji Nishi ◽  
Fang Wang
Keyword(s):  
Electron Microscope ◽  
Data Collection ◽  
High Voltage ◽  
Automatic System ◽  
Electron Tomography ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Tomography Data ◽  
Ultra High Voltage

Image quality of microns-thick specimens in the ultra-high voltage electron microscope

Micron ◽  
2010 ◽  
Vol 41 (5) ◽  
pp. 490-497 ◽  
Author(s):  
Fang Wang ◽  
Hai-Bo Zhang ◽  
Meng Cao ◽  
Ryuji Nishi ◽  
Akio Takaoka
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
High Voltage ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
High Voltage Electron ◽  
Ultra High Voltage
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