Robust, versatile, direct low-frequency noise characterization method for material/process quality control using cross-shaped 4-terminal devices

2005 ◽  
Vol 45 (9-11) ◽  
pp. 1327-1330 ◽  
Author(s):  
A. Kerlain ◽  
V. Mosser
Keyword(s):  
Quality Control ◽  
Low Frequency ◽  
Process Quality ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Material Process ◽  
Noise Characterization

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

Analysis of the substrate bias effect on the interface trapped charges in junctionless nanowire transistors through low-frequency noise characterization

2017 ◽  
Vol 178 ◽  
pp. 17-20 ◽  
Author(s):  
Rodrigo Trevisoli Doria ◽  
Renan Trevisoli ◽  
Michelly de Souza ◽  
Sylvain Barraud ◽  
Maud Vinet ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Substrate Bias ◽  
Low Frequency Noise ◽  
Bias Effect ◽  
Nanowire Transistors ◽  
Noise Characterization

scholarly journals Inkjet-printed graphene Hall mobility measurements and low-frequency noise characterization

Nanoscale ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 6708-6716 ◽  
Author(s):  
Gabriele Calabrese ◽  
Lorenzo Pimpolari ◽  
Silvia Conti ◽  
Fabrice Mavier ◽  
Subimal Majee ◽  
...  
Keyword(s):  
Low Temperature ◽  
Hall Mobility ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization

Inkjet printed graphene is in-depth investigated by means of Hall mobility measurements, low-temperature magnetoresistance analysis, and low frequency noise characterization.

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