Development of ultrahigh resolution alpha particle imaging detector using 1 mm channel size Si-PM array

2018 ◽  
Vol 894 ◽  
pp. 33-38 ◽  
Author(s):  
Seiichi Yamamoto ◽  
Wataru Kawaguchi
Keyword(s):  
Alpha Particle ◽  
Ultrahigh Resolution ◽  
Channel Size ◽  
Imaging Detector ◽  
Particle Imaging

An alpha-particle imaging system for detecting plutonium contamination

1983 ◽  
Vol 212 (1-3) ◽  
pp. 413-418 ◽  
Author(s):  
Takao Iida ◽  
Seiichi Yamamoto ◽  
Yukimasa Ikebe ◽  
Akio Seki ◽  
Kei Nakata ◽  
...  
Keyword(s):  
Alpha Particle ◽  
Imaging System ◽  
Particle Imaging

Development of 200kV ultrahigh-resolution analytical electron microscope

1989 ◽  
Vol 47 ◽  
pp. 108-109
Author(s):  
T. Kaneyama ◽  
M. Naruse ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Optical Constants ◽  
Materials Science ◽  
Objective Lens ◽  
The Finite Element Method ◽  
Ultrahigh Resolution ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Characteristic Features ◽  
Better Than

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.

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