analytical electron microscope
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scholarly journals Sensitivity and Figure of Merit Measurements of EELS vs XEDS in the Analytical Electron Microscope

2020 ◽  
Vol 26 (S2) ◽  
pp. 1518-1521
Author(s):  
Nestor Zaluzec ◽  
Magnus Garbrecht
Keyword(s):  
Electron Microscope ◽  
Figure Of Merit ◽  
Analytical Electron ◽  
Analytical Electron Microscope

scholarly journals Sputtering During Microanalysis in the Analytical Electron Microscope

2020 ◽  
Vol 26 (S2) ◽  
pp. 2068-2070
Author(s):  
Nestor Zaluzec
Keyword(s):  
Electron Microscope ◽  
Analytical Electron ◽  
Analytical Electron Microscope

scholarly journals Development of Monochromatic Analytical Electron Microscope Equipped with Higher-Order Aberration Corrector

2019 ◽  
Vol 25 (S2) ◽  
pp. 590-591
Author(s):  
Masaki Mukai ◽  
Eiji Okunishi ◽  
Akiho Nakamura ◽  
Takaki Ishikawa ◽  
Hidetaka Sawada
Keyword(s):  
Electron Microscope ◽  
Higher Order ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Higher Order Aberration

Improving the sensitivity of X-ray microanalysis in the analytical electron microscope

2019 ◽  
Vol 203 ◽  
pp. 163-169 ◽  
Author(s):  
Nestor J. Zaluzec
Keyword(s):  
Electron Microscope ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope

scholarly journals Soft Matter X-ray Microanalysis in the Analytical Electron Microscope

2018 ◽  
Vol 24 (S1) ◽  
pp. 776-777 ◽  
Author(s):  
Mikhail Ovsyanko ◽  
Emrah Yucelen ◽  
Evgeniya Pechnikova ◽  
Meiken Falke ◽  
Qian Chen ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Soft Matter ◽  
X Ray ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Performances of aberration-corrected monochromatic low-voltage analytical electron microscope

2016 ◽  
pp. 338-339
Author(s):  
Masaki Mukai ◽  
Shigeyuki Morishita ◽  
Hidetaka Sawada ◽  
Kazu Suenaga
Keyword(s):  
Electron Microscope ◽  
Low Voltage ◽  
Analytical Electron ◽  
Analytical Electron Microscope ◽  
Aberration Corrected
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