Optical film thickness measurement of turbid materials using the fractional BiSpectrum noise-reduction technique
1996 ◽
Vol 9
(3)
◽
pp. 365
◽
2010 ◽
Vol 130
(5)
◽
pp. 479-480
2010 ◽
Vol E93-B
(7)
◽
pp. 1788-1796
◽
Keyword(s):
1993 ◽
Vol 64
(8)
◽
pp. 2405-2406
◽
Keyword(s):
1990 ◽
Vol 27
(2)
◽
pp. 190-191