film thickness measurement
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MTZ worldwide ◽  
2021 ◽  
Vol 83 (1) ◽  
pp. 28-37
Author(s):  
Henry Brunskill ◽  
Andrew Hunter ◽  
Hosung Nam ◽  
Junsik Park

2021 ◽  
Author(s):  
Jingwen Li ◽  
Zhen Hua ◽  
Jiao Bai ◽  
Qian Zhou ◽  
Xiaohao Wang ◽  
...  

2021 ◽  
Vol 11 (19) ◽  
pp. 8925
Author(s):  
Sani van der Kley ◽  
Gabriele Goet ◽  
Anna Schmidt ◽  
Valentina Einspieler ◽  
Steven Wagner

In this work, wavelengths were determined for the robust and simultaneous measurement of film thickness, urea concentration and fluid temperature. Film parameters such as film thickness, film temperature and the composition of the film are typically dynamically and interdependently changing. To gain knowledge of these quantities, a measurement method is required that offers a high temporal resolution while being non-intrusive so as to not disturb the film as well as the process conditions. We propose the extension of the FMLAS method, which was previously validated for the film thickness measurement of thin liquid films, to determine temperatures and concentrations using an adapted evaluation approach.


2021 ◽  
pp. 107290
Author(s):  
Pan Dou ◽  
Yaping Jia ◽  
Peng Zheng ◽  
Tonghai Wu ◽  
Min Yu ◽  
...  

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou

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