Simultaneous measurement of optical inhomogeneity and thickness variation by using dual-wavelength phase-shifting photorefractive holographic interferometry

2014 ◽  
Vol 56 ◽  
pp. 241-246 ◽  
Author(s):  
J. Li ◽  
Y.R. Wang ◽  
X.F. Meng ◽  
X.L. Yang ◽  
Q.P. Wang
2006 ◽  
Vol 3-4 ◽  
pp. 223-228 ◽  
Author(s):  
S. Okazawa ◽  
Motoharu Fujigaki ◽  
Yoshiharu Morimoto ◽  
Toru Matui

In this paper, we apply phase-shifting digital holographic interferometry to simultaneous measurement for out-of-plane and in-plane displacements by employing two beam illuminations for an object. Phase-shifted holograms before and after displacements of the object using each of two beams are recorded by a CCD camera, separately. The complex amplitude at each pixel of the CCD plane is analyzed from the holograms taken with phase-shifting. The complex amplitude of he object is reconstructed from the complex amplitude distribution on the CCD plane using the Fresnel diffraction integral. Each directional phase difference distribution is obtained by calculating the phases before and after deformation for each directional beam. The phase distribution for out-of-plane displacements is obtained by calculating the sum of the two phase difference distributions. The phase distribution for in-plane displacements is obtained by calculating the difference of the two phase difference distributions. The phase values provide accurate displacement distribution information. Actually, when the object deforms in both out-of-plane and in-plane directions, it is possible to analyze the displacement distribution in each direction. The theory and an experiment are shown.


2020 ◽  
Vol 56 (6) ◽  
pp. 608-613
Author(s):  
V. I. Guzhov ◽  
E. N. Denezhkin ◽  
S. P. Il’inykh ◽  
G. A. Pozdnyakov ◽  
D. S. Khaidukov

2016 ◽  
Vol 55 (12) ◽  
pp. 124103
Author(s):  
Donghui Zheng ◽  
Lei Chen ◽  
Qinyuan Sun ◽  
Wenhua Zhu ◽  
Jinpeng Li ◽  
...  

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