Effect of O-vacancy defects on the Schottky barrier heights in Ni/SiO2 and Ni/HfO2 interfaces
2012 ◽
Vol 407
(15)
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pp. 2907-2910
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1986 ◽
Vol 4
(3)
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pp. 855-859
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1986 ◽
Vol 25
(Part 2, No. 5)
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pp. L353-L356
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2010 ◽
Vol 87
(11)
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pp. 2358-2360
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2006 ◽
Vol 47
(11)
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pp. 2696-2700
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Keyword(s):
2001 ◽
Vol 32
(1-4)
◽
pp. 251-258
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1989 ◽
pp. 259-268
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Keyword(s):
1989 ◽
pp. 215-234
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