scholarly journals Optical and dielectric results of Y0.225Sr0.775CoO3±δ thin films studied by spectroscopic ellipsometry technique

2013 ◽  
Vol 3 ◽  
pp. 167-172 ◽  
Author(s):  
A.I. Ali ◽  
J.Y. Son ◽  
A.H. Ammar ◽  
A. Abdel Moez ◽  
Y.S. Kim
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Dielectric Results

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

2003 ◽  
Vol 119 (12) ◽  
pp. 6335-6340 ◽  
Author(s):  
M. I. Alonso ◽  
M. Garriga ◽  
J. O. Ossó ◽  
F. Schreiber ◽  
E. Barrena ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

scholarly journals Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films

2021 ◽  
Vol 129 (24) ◽  
pp. 243102
Author(s):  
Kohei Oiwake ◽  
Yukinori Nishigaki ◽  
Shohei Fujimoto ◽  
Sara Maeda ◽  
Hiroyuki Fujiwara
Keyword(s):  
Thin Films ◽  
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Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films

Vacuum ultra-violet spectroscopic ellipsometry study of sputtered BeZnO thin films

Optik ◽  
2011 ◽  
Vol 122 (22) ◽  
pp. 2050-2054 ◽  
Author(s):  
Jebreel M. Khoshman ◽  
Martin E. Kordesch
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Ultra Violet ◽  
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scholarly journals Oxidation of aluminum thin films protected by ultrathin MgF2 layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

OSA Continuum ◽  
2021 ◽  
Vol 4 (3) ◽  
pp. 879
Author(s):  
Brian I. Johnson ◽  
Tahereh G. Avval ◽  
R. Steven Turley ◽  
Matthew R. Linford ◽  
David D. Allred
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Photoelectron Spectroscopy ◽  
X Ray
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