Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films
2021 ◽
Vol 129
(24)
◽
pp. 243102
Kohei Oiwake
◽
Yukinori Nishigaki
◽
Shohei Fujimoto
◽
Sara Maeda
◽
Hiroyuki Fujiwara
2013 ◽
Vol 5
(1)
◽
pp. 9-16
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2003 ◽
Vol 119
(12)
◽
pp. 6335-6340
◽
M. I. Alonso
◽
M. Garriga
◽
J. O. Ossó
◽
F. Schreiber
◽
E. Barrena
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...
2003 ◽
Vol 38
(9)
◽
pp. 773-778
◽
B. Karunagaran
◽
R. T. Rajendra Kumar
◽
C. Viswanathan
◽
D. Mangalaraj
◽
Sa. K. Narayandass
◽
...
2011 ◽
Vol 284
(12)
◽
pp. 3181
2010 ◽
Vol 45
(4)
◽
pp. 464-473
◽
Neelam Kumari
◽
S.B. Krupanidhi
◽
K.B.R. Varma
2009 ◽
Vol 256
(3)
◽
pp. S72-S76
◽
Jean Louis Stehle
◽
Jean Philippe Piel
2011 ◽
Vol 122
(22)
◽
pp. 2050-2054
◽
Jebreel M. Khoshman
◽
Martin E. Kordesch
1994 ◽
Vol 152
(1)
◽
pp. 169-174
◽
2021 ◽
Vol 4
(3)
◽
pp. 879
Brian I. Johnson
◽
Tahereh G. Avval
◽
R. Steven Turley
◽
Matthew R. Linford
◽
David D. Allred
2005 ◽
Vol 44
(6A)
◽
pp. 4015-4018
◽
Naoki Kubo
◽
Akihiro Moritani
◽
Kuninori Kitahara
◽
Shuichi Asahina
◽
Nobuyuki Kanayama
◽
...