Infrared Spectroscopic Ellipsometry analysis of Nano-structured thin films in polymers and semiconductors

2009 ◽  
Vol 256 (3) ◽  
pp. S72-S76 ◽  
Author(s):  
Jean Louis Stehle ◽  
Jean Philippe Piel
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Infrared Spectroscopic

Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry

1998 ◽  
Vol 313-314 ◽  
pp. 692-696 ◽  
Author(s):  
M. Schubert ◽  
E. Franke ◽  
H. Neumann ◽  
T.E. Tiwald ◽  
D.W. Thompson ◽  
...  
Keyword(s):  
Thin Films ◽  
Boron Nitride ◽  
Spectroscopic Ellipsometry ◽  
Mixed Phase ◽  
Infrared Spectroscopic

Infrared spectroscopic ellipsometry of (Pb, La)(Zr, Ti)O3 thin films on platinized silicon

2004 ◽  
Vol 320 (5-6) ◽  
pp. 478-486 ◽  
Author(s):  
Z.G. Hu ◽  
F.W. Shi ◽  
T. Lin ◽  
Z.M. Huang ◽  
G.S. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry ◽  
Infrared Spectroscopic

Strong optical anisotropies of F16CuPc thin films studied by spectroscopic ellipsometry

2003 ◽  
Vol 119 (12) ◽  
pp. 6335-6340 ◽  
Author(s):  
M. I. Alonso ◽  
M. Garriga ◽  
J. O. Ossó ◽  
F. Schreiber ◽  
E. Barrena ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

scholarly journals Fully automated spectroscopic ellipsometry analyses: Application to MoOx thin films

2021 ◽  
Vol 129 (24) ◽  
pp. 243102
Author(s):  
Kohei Oiwake ◽  
Yukinori Nishigaki ◽  
Shohei Fujimoto ◽  
Sara Maeda ◽  
Hiroyuki Fujiwara
Keyword(s):  
Thin Films ◽  
Spectroscopic Ellipsometry

Optical constants of DC magnetron sputtered titanium dioxide thin films measured by spectroscopic ellipsometry

2003 ◽  
Vol 38 (9) ◽  
pp. 773-778 ◽  
Author(s):  
B. Karunagaran ◽  
R. T. Rajendra Kumar ◽  
C. Viswanathan ◽  
D. Mangalaraj ◽  
Sa. K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Titanium Dioxide ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Titanium Dioxide Thin Films
Sign in / Sign up

Export Citation Format

Share Document