Depth-profile analysis of thermoelectric layers on Si wafers by pulsed r.f. glow discharge time-of-flight mass spectrometry

2012 ◽  
Vol 76 ◽  
pp. 175-180 ◽  
Author(s):  
K.-G. Reinsberg ◽  
C. Schumacher ◽  
A. Tempez ◽  
K. Nielsch ◽  
J.A.C. Broekaert
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Depth Profile ◽  
Profile Analysis ◽  
Time Of Flight ◽  
Depth Profile Analysis ◽  
Discharge Time ◽  
Flight Mass Spectrometry

Quantitative depth profile analysis by direct current glow discharge time of flight mass spectrometry

2003 ◽  
Vol 18 (8) ◽  
pp. 864-871 ◽  
Author(s):  
Marta Vázquez Peláez ◽  
José M. Costa-Fernández ◽  
Rosario Pereiro ◽  
Nerea Bordel ◽  
Alfredo Sanz-Medel
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Depth Profile ◽  
Direct Current ◽  
Profile Analysis ◽  
Time Of Flight ◽  
Depth Profile Analysis ◽  
Discharge Time ◽  
Flight Mass Spectrometry

Technical note: Characterization of gold coated ceramics by radiofrequency pulsed glow discharge – time of flight mass spectrometry

2018 ◽  
Vol 33 (3) ◽  
pp. 502-507 ◽  
Author(s):  
Marcos Bouza ◽  
Lara Lobo ◽  
Rocío Muñiz ◽  
Rosario Pereiro ◽  
Joseba Esparza ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Depth Profile ◽  
Time Of Flight ◽  
Technical Note ◽  
Discharge Time ◽  
Pulsed Glow Discharge ◽  
Flight Mass Spectrometry

Depth profile characterization of 6 mm thick industrial ceramics with a golden decorative layer is achieved by PP-TOFMS.

Present and future of glow discharge — Time of flight mass spectrometry in analytical chemistry

2011 ◽  
Vol 66 (6) ◽  
pp. 399-412 ◽  
Author(s):  
Rosario Pereiro ◽  
Auristela Solà-Vázquez ◽  
Lara Lobo ◽  
Jorge Pisonero ◽  
Nerea Bordel ◽  
...  
Keyword(s):  
Analytical Chemistry ◽  
Mass Spectrometry ◽  
Glow Discharge ◽  
Time Of Flight ◽  
Discharge Time ◽  
Flight Mass Spectrometry
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