Investigating silicon wafer based substrates for dried-droplet analysis by Laser-Induced Breakdown Spectroscopy
2019 ◽
Vol 152
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pp. 84-92
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2011 ◽
Vol 20
(4)
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pp. 463-471
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2015 ◽
Vol 113
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pp. 70-78
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2019 ◽
Vol 18
(03)
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pp. 1
2020 ◽
Vol 92
(2)
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pp. 20701
2007 ◽
Vol 127
(7)
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pp. 343-346
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High Temperature Material Processes An International Quarterly of High-Technology Plasma Processes
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2007 ◽
Vol 11
(1)
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pp. 125-147
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