Electronic driver with amplitude and quality factor control to adjust the response of quartz tuning fork sensors in atomic force microscopy applications

Sensors and Actuators A Physical ◽

10.1016/j.sna.2012.06.016 ◽

2012 ◽

Vol 184 ◽

pp. 112-118 ◽

Author(s):

Laura González ◽

Jorge Otero ◽

Gonzalo Cabezas ◽

Manel Puig-Vidal

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Download Full-text

Tapping and shear-mode atomic force microscopy using a quartz tuning fork with high quality factor

10.1117/12.836902 ◽

2008 ◽

Author(s):

Vo Thanh Tung ◽

Sergey A. Chizhik ◽

V. V. Chikunov ◽

Tran Xuan Hoai

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

High Quality Factor ◽

High Quality ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

Download Full-text

Optimizing the Quality Factor of Quartz Tuning Fork Force Sensor for Atomic Force Microscopy: Impact of Additional Mass and Mass Rebalance

IEEE Sensors Journal ◽

10.1109/jsen.2017.2677459 ◽

2017 ◽

Vol 17 (9) ◽

pp. 2797-2806 ◽

Author(s):

Danish Hussain ◽

Jianmin Song ◽

Hao Zhang ◽

Xianghe Meng ◽

Wen Yongbing ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Additional Mass ◽

Force Microscopy ◽

Download Full-text

Electrochemical etching of lightweight nanotips for high quality‐factor quartz tuning fork force sensor: atomic force microscopy applications

Micro & Nano Letters ◽

10.1049/mnl.2017.0924 ◽

2018 ◽

Vol 13 (8) ◽

pp. 1136-1140 ◽

Author(s):

Danish Hussain ◽

Jianmin Song ◽

Hao Zhang ◽

Xianghe Meng ◽

Hui Xie

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Electrochemical Etching ◽

Quartz Tuning Fork ◽

Force Sensor ◽

High Quality Factor ◽

High Quality ◽

Force Microscopy ◽

Download Full-text

QUARTZ TUNING FORK ATOMIC FORCE MICROSCOPY USING A QUALITY-FACTOR CONTROL

Physics, Chemistry and Application of Nanostructures ◽

10.1142/9789812770950_0122 ◽

2007 ◽

Author(s):

V. T. TUNG ◽

S. A. CHIZHIK

Keyword(s):

Atomic Force Microscopy ◽

Quality Factor ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Download Full-text

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

New Physics Sae Mulli ◽

10.3938/npsm.71.439 ◽

2021 ◽

Vol 71 (5) ◽

pp. 439-445

Author(s):

Hyoju CHOE ◽

Dongwon KIM ◽

Manhee LEE* ◽

Myungchul CHOI

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Download Full-text

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Applied Physics Letters ◽

10.1063/1.126067 ◽

2000 ◽

Vol 76 (11) ◽

pp. 1470-1472 ◽

Author(s):

Franz J. Giessibl

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensor ◽

Atomic Resolution ◽

Force Microscopy ◽

Download Full-text

Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

Electrochemistry ◽

10.5796/electrochemistry.82.380 ◽

2014 ◽

Vol 82 (5) ◽

pp. 380-384 ◽

Author(s):

Takashi ICHII ◽

Masahiro NEGAMI ◽

Motohiko FUJIMURA ◽

Kuniaki MURASE ◽

Hiroyuki SUGIMURA

Keyword(s):

Atomic Force Microscopy ◽

Ionic Liquid ◽

Structural Analysis ◽

Phase Modulation ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Microscopy ◽

Organic Monolayer ◽

Download Full-text

Force-gradient-induced mechanical dissipation of quartz tuning fork force sensors used in atomic force microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2010.11.032 ◽

2011 ◽

Vol 111 (3) ◽

pp. 186-190 ◽

Author(s):

A. Castellanos-Gomez ◽

N. Agraït ◽

G. Rubio-Bollinger

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Force Sensors ◽

Force Microscopy ◽

Atomic Force ◽

Mechanical Dissipation

Download Full-text

High quality-factor quartz tuning fork glass probe used in tapping mode atomic force microscopy for surface profile measurement

Measurement Science and Technology ◽

10.1088/1361-6501/aab998 ◽

2018 ◽

Vol 29 (6) ◽

pp. 065014 ◽

Author(s):

Yuan-Liu Chen ◽

Yanhao Xu ◽

Yuki Shimizu ◽

Hiraku Matsukuma ◽

Wei Gao

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Surface Profile ◽

Quartz Tuning Fork ◽

Profile Measurement ◽

High Quality ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy ◽

Surface Profile Measurement

Download Full-text

Self-sensing and self-actuating probe based on quartz tuning fork combined with microfabricated cantilever for dynamic mode atomic force microscopy

Applied Surface Science ◽

10.1016/s0169-4332(02)01471-x ◽

2003 ◽

Vol 210 (1-2) ◽

pp. 18-21 ◽

Author(s):

T Akiyama ◽

U Staufer ◽

N.F de Rooij

Keyword(s):

Atomic Force Microscopy ◽

Tuning Fork ◽

Quartz Tuning Fork ◽

Dynamic Mode ◽

Force Microscopy ◽

Atomic Force ◽

Mode Atomic Force Microscopy

Download Full-text