High quality-factor quartz tuning fork glass probe used in tapping mode atomic force microscopy for surface profile measurement

2018 ◽  
Vol 29 (6) ◽  
pp. 065014 ◽  
Author(s):  
Yuan-Liu Chen ◽  
Yanhao Xu ◽  
Yuki Shimizu ◽  
Hiraku Matsukuma ◽  
Wei Gao
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Surface Profile ◽  
Quartz Tuning Fork ◽  
Profile Measurement ◽  
High Quality ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy ◽  
Surface Profile Measurement

Implementation and characterization of a quartz tuning fork based probe consisted of discrete resonators for dynamic mode atomic force microscopy

2010 ◽  
Vol 81 (6) ◽  
pp. 063706 ◽  
Author(s):  
Terunobu Akiyama ◽  
Nicolaas F. de Rooij ◽  
Urs Staufer ◽  
Manfred Detterbeck ◽  
Dominik Braendlin ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Tip-Substrate Shear Interaction in Quartz Tuning Fork-Based Atomic Force Microscopy in Air

2021 ◽  
Vol 71 (5) ◽  
pp. 439-445
Author(s):  
Hyoju CHOE ◽  
Dongwon KIM ◽  
Manhee LEE* ◽  
Myungchul CHOI
Keyword(s):  
Atomic Force Microscopy ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Atomic Force

Eigenvalue Veering in Quartz Tuning Fork Sensors and its Effect on Dynamic Atomic Force Microscopy

2014 ◽  
Author(s):  
John Melcher
Keyword(s):  
Atomic Force Microscopy ◽  
Resonant Frequency ◽  
Systematic Error ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Attractive Alternative ◽  
Small Shift ◽  
Force Microscopy ◽  
Sensing Applications ◽  
Atomic Force

Quartz tuning fork (QTF) sensors offer an attractive alternative to traditional silicon microcantilevers for sensing applications in dynamic atomic force microscopy (DAFM). The QTF sensor consists of two identical, weakly-coupled tines with a sharp tip affixed to the distal end of one tine. The fundamental anti-phase mode of the QTF achieves a stable resonant frequency with a high Quality factor making it ideal for DAFM applications in which a small shift in the resonant frequency is linked to a tip-sample force. The addition of the tip-sample force also breaks the symmetry of the QTF leading to a classic eigenvalue veering scenario. The eigenvalue veering and accompanying mode localization phenomena violate the standard DAFM modeling assumptions which treat the addition of the tip-sample force as a small perturbation to a single-degree-of-freedom oscillator. We find that the eigenvalue veering can contribute a systematic error in force measurements on the order of 20%. Methodology for correcting the systematic error caused by eigenvalue veering is proposed.

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