Influence of precursor thin films stacking order on the properties of Cu2ZnSnS4 thin films fabricated by electrochemical deposition method

2014 ◽  
Vol 76 ◽  
pp. 339-348 ◽  
Author(s):  
E.M. Mkawi ◽  
K. Ibrahim ◽  
M.K.M. Ali ◽  
M.A. Farrukh ◽  
Nageh K. Allam
2008 ◽  
Vol 517 (4) ◽  
pp. 1461-1464 ◽  
Author(s):  
Atsushi Ashida ◽  
Akio Fujita ◽  
Yonggu Shim ◽  
Kazuki Wakita ◽  
Atsushi Nakahira

RSC Advances ◽  
2014 ◽  
Vol 4 (97) ◽  
pp. 54713-54718 ◽  
Author(s):  
Yannan Mu ◽  
Qian Li ◽  
Pin Lv ◽  
Yanli Chen ◽  
Dong Ding ◽  
...  

Tellurium (Te) source of compact nickel telluride (NiTe) thin film was prepared by simple electrochemical deposition method.


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